| Title |
A Study on ESD Predictive Analysis Technology for System Level Defect Analysis of Rear Camera Module |
| Authors |
김양현(Yanghyun KIM) ; 서철헌(Chulhun Seo) |
| DOI |
https://doi.org/10.5573/ieie.2020.57.9.19 |
| Keywords |
Rear Camera M8odule; ESD Simulation; Image Sensor; ESD gun; Peak Voltage |
| Abstract |
In this paper we propose a study on prediction technology for Electrostatic Discharge(ESD) defect analysis of rear camera module using simulation technology. In addition, a suitable ESD simulation method was developed to satisfy the ESD defect analysis of the proposed rear camera module and the IEC61000-4-2 test condition. The ESD certification test includes contact discharge and air discharge. In this paper, comparative analysis was performed based on the contact discharge condition and simulation modeling was implemented according to the ESD international standard, IEC61000-4-2 and the results were compared under the same conditions. In this study, the same results were obtained by comparing the actual measurement and simulation results by applying the proposed defect analysis technique using ESD simulation. |