| Title |
Fault-tolerant 3-input Majority Gate Design in Quantum-dot Cellular Automata Environment for Building Quantum Computing Environment |
| Authors |
윤상현(Sang-Hyeon Yoon) ; 전준철(Jun-Cheol Jeon) |
| DOI |
https://doi.org/10.5573/ieie.2020.57.9.44 |
| Keywords |
nanotechnology; quantum-dot cellular automata; XOR gate; multi-layer |
| Abstract |
Quantum dot cellular automata (QCA) is a next-generation nano-circuit design technology for realizing a quantum computing environment. It is difficult to avoid defects in designing circuits with QCA. Circuits that are not fault-tolerant may cause abnormalities in the operation of the entire circuit even with minor defects. On the other hand, fault-tolerant circuits are resistant to defects in the circuit. However, the area of ??the conventional fault-tolerant circuit has been increased to secure fault-tolerant performance. This causes a problem in that the performance of fault-tolerant circuits is lower than that of general circuits. Therefore, in this paper, we propose a fault-tolerant multilayered three-input majority gate that solves the area problem, and compare and analyze it with the existing circuits. As a result of the comparative analysis, it can be confirmed that the improvement in area was achieved by at least 19.64% and at most 88.40%. This means that when designing other fault-tolerant circuits in the future, if the 3-input majority-voted gate proposed in this paper is used as a basic device, a significant improvement in performance can be achieved. |