| Title |
A Complete Quadruple-Node-Upset Recoverable Latch with Enhanced Quintuple-Node-Upset Self-Recoverability |
| Authors |
김수현(Suhyeon Kim) ; 장재용(Jaeyong Jang) ; 나태희(Taehui Na) |
| DOI |
https://doi.org/10.5573/ieie.2026.63.8.23 |
| Keywords |
Radiation-hardened latch; Quadruple-node-upset (QNU) self-recoverability; Quintuple-node-upset (QtNU) self-recoverability |
| Abstract |
A radiation-hardened latch is a high-reliability latch designed to protect stored data from single-node-upsets (SNUs) and multiple-node-upsets (MNUs) that may occur in radiation environments. With the continuous scaling of CMOS technology, the likelihood of MNUs has increased, and several complete quadruple-node-upset (QNU) recoverable latches have been proposed; however, existing latches do not guarantee complete recovery from quintuple-node-upset (QtNU). This paper proposes a latch that can self-recover from any QNU while providing enhanced QtNU self-recoverability, and analyzes its QNU and QtNU self-recoverability. |