| Title |
Modulus Properties and Smoothness Measurement of Semiconducting Materials Using the DMA and SEM |
| Authors |
양종석(Yang, Jong-Seok) ; 이경용(Lee, Kyoung-Yong) ; 최용성(Choi, Yong-Sung) ; 박대희(Park, Dae-Hee) |
| Keywords |
Semiconducting Materials ; Carbon Black ; Modulus ; Tan ; Smoothness |
| Abstract |
To measure modulus, damping properties and smoothness of semiconducting materials in power cable, we have investigated those of semiconducting materials showed by changing the content of carbon black. Then they were produced as sheets after pressing for 20 minutes at 180[°C] with a pressure of 200[kg/cm^{2}]. The content of conductive carbon black was the variable, and their contents were 20, 30 and 40[wt %], respectively. The modulus and tans were measured by DMA 2980. The ranges of measurement temperature were from -50[°C] to 100[°C] and measurement frequency was 1[Hz3. The modulus of specimens was increased according to a increment of a carbon black content. And modulus was rapidly decreased at the glass transition temperature. The tans of specimens was decreased according to a increment of a carbon black content. The smoothness was measured by JSM-6400. EEA resin from SEM measurement was best the dispersion of carbon back in base resin. |