| Title |
Characteristics of Holographic Diffraction Grating Formation on AS_{40}Se_{15}S_{35}Ge_{10} Thin Film with the Polarization State of Recording Beam |
| Authors |
박정일(Park, Jeong-Il) ; 정홍배(Chung, Hong-Bay) |
| Keywords |
Holography Data Storage(HDS) ; Two-Beam Interference ; Chalcogenide ; Polarization Holography |
| Abstract |
We have been carried out the two-beam interference method to form the diffraction grating on chalcogenide AS_{40}Se_{15}S_{35}Ge_{10} thin films for Holography Data Storage (HDS). In the present work, we have been formed holographic diffraction gratings using He-Ne laser (632.8nm) under different Polarization state combinations (intensity polarization holography, phase polarization holography). It was obtained the diffraction grating efficiency by 11st order intensity and investigated the formed grating structure using Atomic Force Microscopy (AFM). As the results, it is shown that the diffraction efficiency of (P: P) polarized recording was maximum 2.4% and we found that its value was rather higher than that of other-polarized recordings. From the results, it is confirmed that the efficient holographic grating formation on amorphous chalcogenide AS_{40}Se_{15}S_{35}Ge_{10} films depend on both the spatial variation of intensity and the polarization state of the incident field pattern. |