| Title |
A Image Reconstruction Uing Simulated Annealing in Electrical Impedance Tomograghy |
| Authors |
김호찬(Kim Ho-Chan) ; 부창진(Boo Chang-Jin) ; 이윤준(Lee Yoon-Joon) |
| Keywords |
Electrical impedance tomography ; Simulated annealing ; Inverse problem ; Finite element method |
| Abstract |
In electrical impedance tomography(EIT), various image reconstruction algorithms have been used in order to compute the internal resistivity distribution of the unknown object with its electric potential data at the boundary. Mathematically the EIT image reconstruction algorithm is a nonlinear ill-posed inverse problem. This paper presents a simulated annealing technique as a statistical reconstruction algorithm for the solution of the static EIT inverse problem. Computer simulations with the 32 channels synthetic data show that the spatial resolution of reconstructed images by the proposed scheme is improved as compared to that of the mNR algorithm or genetic algorithm at the expense of increased computational burden. |