| Title |
Operation-Profile Based Lifetime Evaluation of Power Semiconductor Devices in Solid-State Transformer for Urban Railway Vehicles |
| Authors |
Ui-Min Choi ; Jin-Hyuk Park ; Myung-Yong Kim ; June-Seok Lee |
| DOI |
10.6113/TKPE.2020.25.6.496 |
| Keywords |
Railway vehicle; Solid-state transformer; Reliability; Lifetime; Power module |
| Abstract |
The reliability of a solid-state transformer (SST) is one of the important aspects to consider when replacing a conventional low-frequency passive transformer with SST for urban railway vehicles. Lifetime evaluation of SST in the design phase is therefore essential in guaranteeing a certain SST reliability. In this study, a lifetime evaluation of power semiconductor devices in SST is performed with respect to temperature stress. For a case study, a 3 MW SST with three kinds of power modules (one IGBT module and two SiC-MOSFET modules) is used for the lifetime estimation under the operation profile of urban railway vehicles. |