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Title Noise-Robust On-the-Fly Measurement of the On-State Resistance of Power Semiconductor Devices
Authors Junho Shin ; Jong-Won Shin
DOI https://doi.org/10.6113/TKPE.2025.30.2.159
Page pp.159-164
ISSN 1229-2214
Keywords Remaining useful life; On-state resistance; On-the-fly measurement; Curve fitting