| Title |
A Fault Operation of the IPM Due to the Effect of Miller Capacitance and its Solution |
| Authors |
Su-Eog Cho ; Feel-Soon Kang ; Cheul-U Kim |
| Abstract |
This paper analyses a fault operation due to the effect of miller capacitance, which severely influences the performance of the IPMs based on computer-aided simulations, and also it presents a good solution to solve that problem. A miller capacitance existed between gate and collect is very closely related to the stray capacitance formed between gate and emitter, and the value of gate resistor. These relationships are proved by the computer-aided simulation. Based on the PSpice simulation results, a customized IPM employing an auxiliary circuit is presented to minimize a fault operation. And it is compared to the standard IPM by the experimental waveform. As a result, it is verified that a customized IPM has a voltage margin to prevent a fault operation approx. 3 [V]. |