| Title |
A study on the circuit design for DC characteristic inspection of semiconductor devices |
| Authors |
Joon-Seek Kim ; Sang-Sin Lee ; Byung-Joon Chun |
| Keywords |
DC parameter test ; semiconductor device ; inspection error |
| Abstract |
In this paper, we design the circuits for DC parameter test of semiconductor devices. The DC parameter tester is the system which inspects the DC parameters of semiconductor devices. In the designed circuits, voltage(current) forcing current(voltage) sensing methods are used to inspect the parameters. The designed circuits are simulated by OR-CAD. The simulation results have good performance. |