| Title |
A Study on the 2-Dimensional Vision Inspection Algorithm for the Defects Detection of BGA Device |
| Authors |
Kee-Soon Kim ; Joon-Seek Kim ; Hyo-Nam Joo |
| Keywords |
BGA ; inspection ; vision system |
| Abstract |
In this paper, we proposed the 2-dimensional inspection algorithm for micro-BGA(Ball Grid Array) device using a vision system. The proposed method uses the subpixel algorithm for high precision. The proposed algorithm preferentially extracts the package area of device in the input image. After the extraction of package area, each ball areas are extracted by ball search window method. The parameters for inspection are calculated for the extracted ball area. In the simulation results, we have the average error within 17[㎛]. |