| Authors |
Jae-Chul Kim ; Jong-Fil Moon ; Seung-Bock Jung ; Kyu-Ha Choe |
| Keywords |
Flicker ; Power Quality ; Distribution ; Fft ; Wavelet ; Disturbances |
| Abstract |
This paper studies a more exact flicker evaluation method by detecting power quality disturbances and excluding the effects of power quality disturbances. Up to the present, power quality disturbances affect flicker evaluation index because power quality problems do not have been considered. However, flick index should represent only flicker without power quality disturbances. Thus, in this paper, we present the improved flicker evaluation method which removing the effects of power quality disturbances such as voltage sag and transient caused by fault and inverter/breaker switching. We detect voltage sag and transient using wavelet transform and remove the effects of power quality disturbances from flicker index. |