| Title |
An Improved Model for Grounding System Using Examination of Dangerous Voltage |
| Authors |
Soon-Seuk Hong ; Bog-Sung Shin |
| Keywords |
Grounding grid ; Dangerous voltage ; Touch Voltage ; IEEE Std. 80 |
| Abstract |
When we design the grounding grid, dangerous voltage IEEE Std. 80 method has been commonly used in the domestic area. However there is not appropriative examination of ground design environment, So in this paper, we examined of IEEE Std. 80 touch voltage method"s marginal utility and we induced corrective factor for those problems by comparison between IEEE Std. 8J touch voltage value and simulation experimentation value. Moreover, Logistic model"s corrective factor we proved the maximum accidental error has reduced less than 10[%]. |