| Title |
Reliability on the Unintended Trips of Residual Current Operated Circuit Breakers due to Surge Currents |
| Authors |
Bok-Hee Lee ; Sang-Hyun Kim ; You-Ha Kim |
| DOI |
http://dx.doi.org/10.5207/JIEIE.2012.26.5.079 |
| Keywords |
Residual Current Device ; Leakage Current ; 1.2/50[㎲] Impulse Voltage ; 8/20[㎲] Impulse Current ; Unintended Trip |
| Abstract |
As the huge economical loss and function paralysis of information technology-based systems can be caused by the misoperation of residual current devices(RCDs) due to surge voltages and currents, RCDs shall not operate by surge currents. In this paper, in order to evaluate the reliability of residual current operated circuit-breakers with integral overcurrent protection for household and similar uses((RCBOs) stressed by surges, the unintended trip characteristics of RCBOs under surge currents were experimentally investigated using the combination wave generator. Seven different types of single-phase RCBOs being present on the domestic market were investigated according to KS C IEC 61009-1 standard. As a result, all kinds of specimens were satisfied the requirements for 0.5 [㎲]/100[㎑] ring wave impulse currents. Most of specimens stressed by the 8/20[㎲] impulse current tripped at least one or more, and some of them were broken down during consecutive tests. It was found that only one type of specimens meets the L-N mode immunity to the combination wave of 1.2/50[㎲] impulse voltage and 8/20[㎲] impulse current. |