| Title |
A Development of Fast Speed Monte-Carlo Ray Tracing Method and Study of the Characteristics of an Absolute Reflectometer |
| Authors |
Han-Pil Kim ; Seok-Joo Byun ; Min Yong Jeon ; Jong-Sik Park |
| DOI |
http://dx.doi.org/10.5207/JIEIE.2014.28.6.007 |
| Keywords |
Monte Carlo ; Ray Tracing ; Absolute Reflectance ; Integrating Sphere ; Reflectometer |
| Abstract |
We proposed a new algorithm to improve the calculation speed of forward ray tracing method which was quite a problem in conventional Monte Carlo algorithm. To verify the accuracy and the effect of improving calculation speed, we directly compared integrating sphere characteristics with conventional ray tracing algorithm under the same condition which was referred in a reference paper. By applying new algorithm to an absolute reflectometer, we calculated the degree of errors which were caused by baffle and port characteristics to find optimal system design condition. |