JungMyung-Hun1
YangHyeon-Jin1
ShinHye-Seong1
GoYoung-Gil1
KimJung-Sik2
MoonYongsam1
-
(
School of Electrical and Computer Engineering, University of Seoul,
Seoul, Korea)
-
(
Samsung Electronics Inc., Hwasung, Korea )
Copyright © The Institute of Electronics and Information Engineers(IEIE)
Index Terms
Discrete tuning, jitter, phase-locked loop, phase noise, quantization error, voltagecontrolled oscillator (VCO)
I. INTRODUCTION
As the various chip-to-chip interface specifications become popular, researches on
high-speed interface circuits are inevitable. To this end, it is important to improve
both the operating frequency and low-jitter characteristics of a phase-locked loop
(PLL).
Since a ring-VCO has at least three delay cells, the operating frequency of a ring-VCO
is usually lower than that of a LC-VCO. The delay of a ring-VCO’s cells is controlled
by not only a control voltage but also a supply voltage, thereby suffering from supply
noise. For these reasons, PLLs are increasingly adopting LC-VCOs rather than ring-VCOs.
However, the disadvantages of an LC-VCO are that a spiral inductor occupies large
area and the capacitance of an LC-VCO should be adjusted to compensate for the (approximately
10 to 15%) process variation of the inductor. The method of adjusting the capacitance
is called a discrete tuning algorithm. In conclusion, an LC-VCO needs to be employed
to satisfy the high-speed operation and low-jitter characteristics, but the area of
the inductor should be minimized and a precise discrete tuning algorithm should be
developed.
There are roughly two types of coarse tuning algorithms. The first method adjusts
the capacitor bank when a VCO control voltage (V$_{\mathrm{CTRL}}$) is outside a certain
range (1,2). The other method adjusts the capacitor bank according to frequency counting while
V$_{\mathrm{CTRL}}$ is fixed (3-5). Fig. 1(a) illustrates the former method and Fig. 1(b) illustrates the latter method.
Fig. 1. Coarse tuning algorithm using (a) a voltage range
monitor and (b) a frequency counter.
Fig. 2. Comparison of the proposed discrete tuning algorithm ($CB_{P}$[5:0]) with
the conventional algorithm ($CB_{C}$[5:0]). (a) The conventional algorithm and (b)
the proposed algorithm with slightly larger inductance ($L = {L}_{nom}$ + $\Delta
L$). (c) The conventional algorithm and (d) the proposed algorithm with slightly smaller
inductance ($L = {L}_{nom}$ ${-}$ $\Delta L$)
Suppose that the initial V$_{\mathrm{CTRL}}$ exists slightly above V$_{\mathrm{Low}}$
as shown in Fig. 1(a). Due to voltage or temperature variation, V$_{\mathrm{CTRL}}$ can be moved to a value
lower than V$_{\mathrm{Low}}$ (Process ①). The adjacent lower VCO curve is selected
according to the output results of voltage comparators (Process ②). The locking operation
of the PLL moves V$_{\mathrm{CTRL}}$ to a new value (Process ③).
In Fig. 1(b), V$_{\mathrm{CTRL}}$ is fixed to V$_{\mathrm{Mid}}$ during the discrete tuning process.
V$_{\mathrm{Mid}}$ is determined considering the characteristics of related circuits
such as the output common-mode voltage of an LC-VCO, the dynamic range of a charge
pump, and the C${-}$V characteristic of a fine-tuning varactor.
A frequency counter generates UP/DN signals, which decrease/increase a capacitor-bank
control signal (CB), thereby selecting a new VCO curve (Process ⓐ). The difference
between the target VCO frequency (target fvco) and the selected fvco is defined as
$\Delta$fvco as shown in Fig. 1(b). After VCO-curve selection is finished, V$_{\mathrm{CTRL}}$ is released and the
fine tuning process begins. And then the PLL locks to the reference clock by means
of control V$_{\mathrm{CTRL}}$ (Process ⓑ ). During the fine-tuning process, V$_{\mathrm{CTRL}}$
is approaching to the target V$_{\mathrm{CTRL}}$ . The difference of this target
V$_{\mathrm{CTRL}}$ to V$_{\mathrm{Mid}}$ is defined as $\Delta$ V$_{\mathrm{CTRL}}$
. According to the definition of VCO gain ($K_{VCO}$ ), the following relationship
is established between $\Delta$ V$_{\mathrm{CTRL}}$ and $\Delta$fvco. It is desirable
that |$\Delta$ V$_{\mathrm{CTRL}}$ | and |$\Delta$fvco| are both minimized for best
circuit performance.
We have improved the latter method and suggest a more precise discrete tuning algorithm,
which selects the nearest VCO curve to the target. Section II describes the proposed
algorithm through the comparison with a conventional algorithm. Section III describes
the PLL design based on an LC-VCO. Section IV describes the performance measurement
results of the PLL. And finally, Section V concludes this paper.
II. DISCRETE TUNING ALGORITHM
1. Conventional Algorithm vs Proposed Algorithm
Assume slightly larger inductance ($L=L_{\mathrm{nom}}$ + $\Delta L$ ) for Fig. 2(a-b) and slightly smaller inductance ($L=L_{\mathrm{nom}}$ ${-}$ $\Delta L$ ) for Fig. 2(c-d). Fig. 2(a) and (c) illustrate the conventional method while Fig. 2(b) and (d) illustrate the proposed method. $CB_{C}$[5:0] denotes a capacitor-bank control
signal (CB) for the conventional method while $CB_{P}$[5:0] denotes CB for the proposed
method. It is assumed that the target fvco is 10.2 GHz and V$_{\mathrm{Mid}}$ is
0.4 V.
In Fig. 2(a-b), it is assumed that the target VCO frequency exists between C16 (the VCO curve when
CB[5:0] = “010000”) and C17 (the VCO curve when CB[5:0] = “010001”). |$\Delta$fvco$_{\mathrm{@C16}}$|
< |$\Delta$f$_{\mathrm{VCO@C17}}$| so the nearest VCO curve is C16. $\Delta$fvco$_{\mathrm{@C16}}$
stands for $\Delta$fvco in case that C16 is selected. $\Delta$fvco$_{\mathrm{@C17}}$
stands for $\Delta$fvco in case that C17 is selected.
In Fig. 2(a), the conventional method randomly selects either C16 or C17. In Fig. 2(b), C16 is selected. Therefore, |$\Delta$fvco| in Fig. 2(b) is equal to or smaller than |$\Delta$fvco| in Fig. 2(a).
In Fig. 2(c-d), all the VCO curves are shifted up due to slight inductance reduction ($L=L_{\mathrm{nom}}
- \Delta L$), resulting to |$\Delta$fvco$_{\mathrm{@C16}}$| > |$\Delta$fvco$_{\mathrm{@C17}}$|.
In Fig. 2(c), either C16 or C17 is randomly selected. In Fig. 2(d), C17 is selected. Therefore, |$\Delta$fvco| in Fig. 2(d) is equal to or smaller than |$\Delta$fvco| in Fig. 2(c).
Fig. 3. Comparison of the proposed discrete tuning algorithm ($CB_{P}$[5:1] ) with
the conventional algorithm ($CB_{C}$[5:0]). (a) The conventional algorithm and (b)
the proposed algorithm with slightly larger inductance ($L = {L}_{nom}$ + $\Delta
L$). (c) The conventional algorithm and (d) the proposed algorithm with slightly smaller
inductance ($L = {L}_{nom}$ ${-}$ $\Delta L$).
The shift-up or shift-down of the VCO curves can be caused by not only the inductance
variation but also other process, voltage, and temperature (PVT) variations. In conclusion,
even if the VCO curves are shifted according to PVT variations including the inductance
variation, |$\Delta$fvco| of the proposed method is equal to or smaller than |$\Delta$fvco|
of the conventional method. As shown in Fig. 1(b) and the equation (1), as |$\Delta$fvco| decreases, so does |$\Delta$V$_{CTRL}$|. This means that $V_{CTRL}$
gets closer to VMid. Therefore, as mentioned above, the proposed method shows better
circuit performance than that of the conventional method. In other words, the proposed
method using the same bit number of a capacitor-bank control signal ($CB_{P}$[5:0])
will have additional 1-bit resolution. Fig. 3 describes this in detail.
2. Conventional Algorithm with $CB_{C}$[5:0] vs Proposed Algorithm with $CB_{P}$[5:1]
In Fig. 3, it is assumed that the conventional method uses $CB_{C}$[5:0] and the proposed method
uses $CB_{P}$[5:1] . Fig. 3(a) and (c) are the same as Fig. 2(a) and (c), respectively. Fig. 3(b) and (d) shows the proposed method using $CB_{P}$[5:1] . A major difference of the
proposed method compared to the conventional method is that every other curve disappears
by removing the LSB ($CB_{P}$[0]) of $CB_{P}$[5:0].
Fig. 4. Input/output characteristic of the conventional and the proposed discrete
tuning algorithms.
In Fig. 3(b), C16 is selected, leading to $\Delta$fvco$_{\mathrm{@C16}}$. Therefore, |$\Delta$fvco|
in Fig. 3(b) is equal to or smaller than |$\Delta$fvco| in Fig. 3(a). In Fig. 3(d), C16 is selected, leading to $\Delta$fvco$_{\mathrm{@C16}}$. Therefore, |$\Delta$fvco|
in Fig. 3(d) is equal to or greater than |$\Delta$fvco| in Fig. 3(c).
Fig. 4 shows the input/output characteristics of the discrete tuning algorithms with CB.
The fvco on the x-axis means the target fvco and the fvco on the y-axis means the
fvco selected right after discrete tuning. Quantization error on the y-axis means
the difference ($\Delta$fvco) between the target fvco and the selected fvco. In the
conventional method, quantization error can have two values because either of the
two VCO curves is selected randomly.
However, in the proposed method, quantization error has only one value because the
nearest VCO curve is selected. Fig. 5(a-b) again show quantization errors of the conventional algorithm and the proposed algorithm
respectively. As shown in the following formula, the mean square value ($\overline{\mathcal{ε}^{2}}$)
of quantization error (ε) is derived in the same way for both the conventional and
the proposed algorithms. Despite a 1-bit reduction in LSB of the CB control signal,
the proposed method has the same ($\overline{\mathcal{ε}^{2}}$) as the conventional
method.
Fig. 5. Quantization errors of the conventional and the proposed discrete tuning algorithms.
From the point of view of circuit design, the operating frequency of the LC-VCO can
increase slightly because the parasitic capacitance corresponding to LSB (CB[0]) is
removed. And the design of the capacitor bank can be easier since the metal capacitor
for the LSB has about 9.5 fF and its size is too small to be supported by process
design kits (PDKs).
III. PLL DESIGN BASED ON LC-VCO
The designed LC-VCO circuit is shown in Fig. 6. A 5-bit cap bank is incorporated for the discrete tuning of the VCO frequency and
varactors are used for fine tuning. A Gm-cell consists of cross-coupled NMOS and PMOS
pairs, replenishing the energy lost by the parasitic resistance of the inductor, the
cap bank, and the varactors. As shown in Fig. 7, the LC-VCO exhibits thirty two curves with CB[5:1].
Fig. 6. The LC-VCO circuit
Fig. 7. Simulated VCO curves of LC-VCO.
The Gm-cell is biased by a top-current source because the top-current structure has
higher supply-noise immunity than the bottom-current structure. Since the bias circuit
for the LC-VCO is designed to maintain the value of ‘V$_{DD}$ - V$_{pbias}$’, the
current of the current source rarely varies even if supply noise occurs and thus the
DC value of LC-VCO’s outputs is not significantly changed. As a result, $\frac{\partial
f_{v c o}}{\partial V D D}$ VDD is minimized.
Fig. 8. Block diagram of the overall PLL.
Fig. 8 is the block diagram of the overall PLL. The LC-VCO generates 10.2-GHz clocks and
delivers them to a current-mode-logic divide-by-2 circuit (CML DIV2) to create 5.1-GHz
clocks (PLL_CLK). In order to reduce the size of the inductor, 10.2-GHz frequency
is created instead of 5.1-GHz frequency. PLL_CLK is divided by 30 to be a 170-MHz
clock (PCLK170X), which is connected to an input signal (PCLK) of Frequency Counter.
REF_CLK (85 MHz) is divided by 200, generating REFCLK_N (425 kHz).
Fig. 9. Block diagram of the proposed Frequency Counter.
Fig. 9 is the block diagram of Frequency Counter. The clock cycles of PCLK are counted to
be CNT2. REFCLK_N samples CNT2 to generate CNT1 and delays CNT1 to create CNT0. INC1
(= CNT1 - CNT0) corresponds to the Counter value increased during one period of REFCLK_N.
INC1 is compared with a threshold value K (= 400) to determine how high or low the
frequency of PCLK is (DIFF1 = INC1 - K).
CB_Control in Fig. 8 receives UP_DN1, UP_DN0, and GRAVITY1 signals, thereby generating CB[5:1] and FREEZE.
During the discrete tuning process, CB_Control keeps FREEZE at “1” to hold $V_{CTRL}$.
The proposed discrete tuning algorithm consists of binary search and then linear search.
During the binary search process, CB[5] to CB[1] are sequentially determined, which
is similar to the methods presented in (6-7). Assume the relationship between CB[5:1] and VCO curves as shown in Fig. 3(b), Fig. 3(d), and Fig. 10. CB[5:1] is “10000 (C32)” in the first REFCLK_N period (T1 period), “01000 (C16)”
in T2 period, “01100 (C24)” in T3 period, “01010 (C20)” in T4 period, “01001 (C18)”
in T5 period, and “01000 (C16)” in T6 period.
Afterwards, if the direction of VCO-curve selection is changed in the linear search
step, the optimal value is selected between the CB values for the current and previous
two periods and the discrete tuning process is finished. The optimal value corresponds
to the nearest VCO curve.
Fig. 10 illustrates an example timing diagram of the Discrete Control block. Suppose the
LC-VCO frequency (fvco) in T5 period is 10.12 GHz, which is lower than the ideal value
(10.2 GHz). In T6 period, INC1 = 397 and DIFF1 = 3. DIFF1 is negative and UP_DN1
is ‘0’ to decrease CB[5:1], thereby increasing fvco. DIFF1 is one-period delayed to
generate DIFF0. GRAVITY1 is generated using the sign of the sum (MASS1) of DIFF1 and
DIFF0.
If UP_DN1 is different from UP_DN0, it indicates that the direction of VCO-curve selection
is changed and the discrete tuning process has been completed. Therefore, FREEZE is
set to be ‘0’ as shown in T7 period.
Fig. 10. Timing diagram of discrete control.
In the end of the discrete tuning process, GRAVITY1 determines the final value of
CB[5:1]. As shown in Fig. 10, GRAVITY1 is ‘0’ in T7 period so a lower value (“01000”) is chosen between CB[5:1]
in T6 period and CB[5:1] in T5 period. If GRAVITY1 = ‘1’, a larger value (“01001”)
would have been chosen.
IV. EXPERIMENTAL RESULTS
The PLL with a Discrete Control block is designed using a 28-nm CMOS process. A serializer
(P2S) and a driver are incorporated to monitor a PLL’s clock signal. Fig. 11 shows the layout of the PLL, whose area is 324 μm × 432 μm. The layout size of the
inductor is 169 $\mu$m × 169 $\mu$m. The S-parameter of the inductor is extracted
using EMX tool and post-layout simulations are performed.
Fig. 12 shows a photograph of the chip. For the impedance matching, both transmission lines
of the test board and the output impedance of the driver are designed to have 50 ohms.
Fig. 13 shows a measurement environment. JBERT provides a trigger clock to the sampling scope
and an 85-MHz reference clock (Ref_Clk) to the device under test (DUT). As shown in
Fig. 8, the serializer (P2S) in the DUT was preset to generate a clock ("1010") pattern.
Using the differential signals (TXP and TXN) as inputs of a sampling scope and a spectrum
analyzer, jitter, phase noise, and frequency spectrum are measured.
Fig. 12. Photograph of the chip.
Fig. 13. Configuration of the measurement setup.
Fig. 14 shows the measured spectrum of the transmitted PLL clock in the free-running mode.
For this mode, CB[5:1] is forced to the desired value and FREEZE is forced to '1'
by means of setting TEST_EN = '1' as shown in Fig. 8. Fig. 14(a) shows that the transmitted PLL clock has 5.07 GHz when CB[5:1] = "01001". Fig. 14(b) shows that it has 5.12 GHz when CB[5:1] = "01000".
Fig. 14. Measured spectrum of the transmitted PLL clock in free running mode (a) when
CB[5:1] = “01001” (5.07 GHz) and (b) when CB[5:1] = “01000” (5.12 GHz).
Fig. 15. Measured spectrum of the transmitted PLL clock in reference-locking mode
with (a) 100-MHz span and (b) 10-MHz span.
Fig. 16. Measured phase noise of (a) the reference clock and (b) the transmitted PLL
clock
Fig. 15 shows the measured spectrum when the PLL locks to the reference clock, exhibiting
5.1 GHz. Because the Discrete Control block selects the VCO curve closest to the target
during the discrete tuning process, it is expected that CB[5:1] was "01000" as shown
in Fig. 14(b). In the free-running mode, as shown in Fig. 14(a-b), there is significant VCO phase noise near the center frequency. However in the reference-locking
mode (Fig. 15), the VCO phase noise is quite suppressed.
Fig. 16 shows the measured phase noise. The phase noise of the reference clock is -116.28
dBc/Hz at a frequency offset of 100 kHz and the phase noise of the transmitted PLL
clock is -94.21 dBc/Hz at a frequency offset of 100 kHz.
Fig. 17 shows the output waveforms and jitter characteristics measured by the oscilloscope.
For jitter analysis a built-in software in the oscilloscope is used. In measuring
jitter, the hit number is approximately 10k. The jitter of the reference clock is
as follows. RJ (Random Jitter) = 1 ps, DJ (Deterministic Jitter) = 0 ps, and TJ (Total
Jitter) = 13.6 ps. The jitter of the transmitted PLL clock is as follows. RJ = 1.29
ps, DJ = 2.3 ps, and TJ = 20.1 ps.
Fig. 17. Using a built-in jitter analysis software, measured waveforms and jitter
characteristics of (a) the reference clock and (b) the transmitted PLL clock.
Suppose that $\sigma$(x) is the RMS jitter of the reference clock and $\sigma$(y)
is the RMS jitter of the PLL itself, where $\sigma$(x + y) may correspond to the RMS
jitter of the transmitted PLL clock in Fig. 17(b). If we can use $\sigma^{2}$2(x + y) = $\sigma^{2}$2(x) + $\sigma^{2}$2(y), where
$\sigma$(x + y) = 1.29 ps and $\sigma$(x) = 1 ps, the RMS jitter of the PLL itself
is approximately 815 fs.
Fig. 18 represents the jitter histogram of the transmitted PLL clock. The measured jitter
is 1.55-ps RMS and 12.1-ps peak-to-peak. Under the same measurement condition, the
reference clock jitter is 1.24-ps RMS and 9.8-ps peak-to-peak.
Table 1 summarizes the measured performance of the test chip. The driver has power consumption
of 23 mW with a 1-V supply at 10.2-GHz LC-VCO frequency. The PLL incorporating the
LC-VCO consumes 3 mW at the same condition.
Fig. 18. Jitter histogram of the transmitted PLL clock in the
reference-locking mode.
Table 1. Performance Characteristics of Test Chip
Table 2. Performance Comparison with LC-VCOs
V. CONCLUSIONS
An 8.48-to-11.13 GHz LC-VCO is designed for a PLL. For the discrete tuning of the
LC-VCO, a new algorithm to select the VCO curve closest to the target frequency is
proposed, which exhibits additional 1-bit resolution. The proposed algorithm even
with the LSB of the capacitor-bank control signal being removed shows the same level
of quantization error as the conventional algorithm. The PLL is implemented using
a 28-nm CMOS process and it occupies 0.14 mm$^{2}$. The transmitted PLL clock has
a phase noise of -94.21 dBc/Hz at 100-kHz offset and the jitter of
815-fs RMS can be obtained by de-embedding the jitter of the reference clock. The
PLL and the driver have power consumption of 3 mW and 23 mW respectively with a 1-V
supply at 10.2-GHz LC-VCO frequency.
ACKNOWLEDGMENTS
This research was supported by the MOTIE(Ministry
of Trade, Industry & Energy (10080285) and
KSRC(Korea Semiconductor Research Consortium)
support program for the development of the future
semiconductor device.
This paper is supported by Future Interconnect
Technology Cluster Program of Samsung Electronics.
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Author
Myung-Hun Jung was born in Gyeonggi-do, Korea, in 1990.
He received the B. S. and the M. S. degrees in the School of Electrical and Computer
Engineering, University of Seoul, Seoul, Korea, in 2018 and 2020, respectively. In
2020, he joined Samsung Electronics, Hwasung, Korea.
His current research interests include phase-locked loop and LC-VCO circuits for high-speed
communication and high-speed I/O interface circuits.
Hyeon-Jin Yang was born in Yecheon, Korea, in 1995.
He received the B.S. degree in the School of Electrical and Computer Engineering,
University of Seoul, Seoul, Korea, in 2018.
He is currently working toward the M. S. degree at the same university.
His research interests include clock and data recovery for high-speed communication
and high-speed I/O interface circuits.
Hye-Seong Shin was born in Incheon, Korea, in 1993.
He received the B. S. degree in the School of Electrical and Computer Engineering,
University of Seoul, Seoul, Korea, in 2019.
He is currently working toward the M.S. degree at the same university.
His current research interests include clock and data recovery for high-speed communication
and high-speed I/O interface circuits.
Young-Gil Go was born in Sokcho, Korea, in 1994.
He received the B.S degrees in the School of Electrical and Computer Engineering,
University of Seoul, Seoul, Korea, in 2019.
He is currently working toward the M. S. degree at the same university.
His research interest include clock and data recovery for high-speed communication
and high-speed I/O interface circuits.
Jung-Sik Kim was born in Seoul, Korea.
He received the B.S. and M.S. degrees in the School of Electrical and Computer Engineering,
University of Seoul, Seoul, Korea, in 2017 and 2019, respectively.
In 2019, he joined Samsung Electronics, Hwasung, Korea.
His interest includes LC voltage-controlled oscillators and phase locked loop circuits.