ChoiJune-Heang
KimHyungtak
ChaHo-Young*
Copyright © The Institute of Electronics and Information Engineers(IEIE)
Index Terms
AlGaN/GaN heterojunction, Pd catalyst, Schottky-diode-type hydrogen sensor, stability, constant current bias mode
I. INTRODUCTION
Schottky-diode-type hydrogen sensors were fabricated on an AlGaN/GaN-on-Si heterojunction
platform using a Pd catalyst. Pd is considered a suitable catalyst for hydrogen detection
owing to its high hydrogen adsorption and diffusion properties (9). The AlGaN/GaN heterojunction epitaxial structure comprises a 10-nm in-situ $\text{SiN}_\text{x}$
passivation layer, a 3.5 nm GaN cap layer, a 23 nm $Al_{0.24}Ga_{0.76}N$ barrier layer,
and a 4.2 ${μ}$m GaN buffer layer grown on a (111)-oriented silicon substrate. The
epitaxial wafer exhibited a two-dimensional electron gas (2DEG) concentration of 9
${\times}$ 1012 cm$^{-2}$ and an electron mobility of 1,470 cm$^{2}$/Vs.
The fabrication process of the hydrogen sensor is as follows. After solvent cleaning,
the cathode ohmic area was defined by photolithography, under which the in situ $\text{SiN}_\text{x}$,
GaN cap, and AlGaN barrier layers were etched. The $\text{SiN}_\text{x}$ was etched
using $CF_4$-based inductively coupled plasma-reactive ion etch (ICP-RIE), whereas
the GaN and AlGaN layers were etched using $Cl_{2}/BCl_{3}$-based ICP-RIE. The AlGaN
barrier layer was partially etched, leaving a 10 nm thick AlGaN layer. A Ti/Al/Ni/Au
(= $200/1200/250/500$ Å) metal stack was then used for the ohmic contacts and was
annealed at 830$^{\circ}$C for 30 s in an N2 ambient using a rapid thermal annealing
process. The active area isolation was then performed by the same plasma etching recipe
as that used for the ohmic contact process. The etch depth for isolation was ~350
nm. The measured contact resistance and sheet resistance were 0.81 ${\omega}$mm and
860 ${\omega}$/sq, respectively. The catalyst anode area of diameter 100 ${\mathrm{\mu}}$m
was patterned and etched down to the middle of the AlGaN barrier layer using similar
$CF_4$ and $Cl_{2}/BCl_{3}$-based etching recipes. The remaining AlGaN layer thickness
was ~8 nm. The distance between the catalyst anode and the ohmic cathode was 5 ${μ}$m.
A 30 nm thick Pd film was evaporated as the catalyst material. A Ti/Au (= 20/250 nm)
metal stack was then used to deposit the pad electrodes, and a 100 nm thick $\text{SiN}_\text{x}$
film was deposited at 190$^{\circ}$C using a $SiH_{4}/N_{2}$ gas mixture and plasma-enhanced
chemical vapor deposition. Finally, the catalyst window and electrode contact areas
were etched with a $CF_4$-based plasma etching recipe. The microscopic top-view image
and cross-sectional schematic of the fabricated AlGaN/GaN-on-Si hydrogen sensor and
the transmission electron microscopy (TEM) cross-sectional image for the catalyst
region are shown in Fig. 1(a)-(c), respectively.
II. EXPERIMENTS AND DISCUSSION
1. Sensor Fabrication
Schottky-diode-type hydrogen sensors were fabricated on an AlGaN/GaN-on-Si heterojunction
platform using a Pd catalyst. Pd is considered a suitable catalyst for hydrogen detection
owing to its high hydrogen adsorption and diffusion properties (9). The AlGaN/GaN heterojunction epitaxial structure comprises a 10-nm in-situ $\text{SiN}_\text{x}$
passivation layer, a 3.5 nm GaN cap layer, a 23 nm $Al_{0.24}Ga_{0.76}N$ barrier layer,
and a 4.2 ${μ}$m GaN buffer layer grown on a (111)-oriented silicon substrate. The
epitaxial wafer exhibited a two-dimensional electron gas (2DEG) concentration of 9
${\times}$ 1012 cm$^{-2}$ and an electron mobility of 1,470 cm$^{2}$/Vs.
The fabrication process of the hydrogen sensor is as follows. After solvent cleaning,
the cathode ohmic area was defined by photolithography, under which the in situ $\text{SiN}_\text{x}$,
GaN cap, and AlGaN barrier layers were etched. The $\text{SiN}_\text{x}$ was etched
using $CF_4$-based inductively coupled plasma-reactive ion etch (ICP-RIE), whereas
the GaN and AlGaN layers were etched using $Cl_{2}/BCl_{3}$-based ICP-RIE. The AlGaN
barrier layer was partially etched, leaving a 10 nm thick AlGaN layer. A Ti/Al/Ni/Au
(= $200/1200/250/500$ Å) metal stack was then used for the ohmic contacts and was
annealed at 830$^{\circ}$C for 30 s in an N2 ambient using a rapid thermal annealing
process. The active area isolation was then performed by the same plasma etching recipe
as that used for the ohmic contact process. The etch depth for isolation was ~350
nm. The measured contact resistance and sheet resistance were 0.81 ${\omega}$mm and
860 ${\omega}$/sq, respectively. The catalyst anode area of diameter 100 ${\mathrm{\mu}}$m
was patterned and etched down to the middle of the AlGaN barrier layer using similar
$CF_4$ and $Cl_{2}/BCl_{3}$-based etching recipes. The remaining AlGaN layer thickness
was ~8 nm. The distance between the catalyst anode and the ohmic cathode was 5 ${μ}$m.
A 30 nm thick Pd film was evaporated as the catalyst material. A Ti/Au (= 20/250 nm)
metal stack was then used to deposit the pad electrodes, and a 100 nm thick $\text{SiN}_\text{x}$
film was deposited at 190$^{\circ}$C using a $SiH_{4}/N_{2}$ gas mixture and plasma-enhanced
chemical vapor deposition. Finally, the catalyst window and electrode contact areas
were etched with a $CF_4$-based plasma etching recipe. The microscopic top-view image
and cross-sectional schematic of the fabricated AlGaN/GaN-on-Si hydrogen sensor and
the transmission electron microscopy (TEM) cross-sectional image for the catalyst
region are shown in Fig. 1(a)-(c), respectively.
2. Sensor Characterization
Sensor characterization was conducted using a hydrogen gas concentration of 4% at
various temperatures, i.e., 25$^{\circ}$C, 100$^{\circ}$C, 150$^{\circ}$C, 200$^{\circ}$C,
and 250$^{\circ}$C. The current–voltage characteristics with and without hydrogen
injection as a function of temperature are plotted in Fig. 2(a). The current levels were observed to increase with hydrogen injection regardless
of the temperature, which was associated with the reduced surface potential caused
by the Pd-H chemical reaction (10,11). The dipole effects of the hydrogen atoms lowered the surface potential of the AlGaN/GaN
heterojunction, thereby enhancing the 2DEG concentration. This reaction is reversible
and can be recovered to the initial state when hydrogen injection is terminated.
The hydrogen sensor response is defined by Eq. (1) (12).
where Igas is the current measured with hydrogen injection and $I_{air}$ is the standby
current without hydrogen injection. The calculated response characteristics as a function
of temperature are shown in Fig. 2(b). The responses of the sensor were enhanced as the temperature increased up to 200oC,
which was owing to the enhanced dissolution of the hydrogen atoms on the Pd surface
(13). However, no further enhancement was observed at 250oC due to the saturated catalytic
reaction. A maximum response of ~30% was achieved at 200$^{\circ}$C.
Fig. 2. (a) Current–voltage, (b) response characteristics of the fabricated Pd-functionalized
AlGaN/GaN-on-Si diode-type hydrogen sensor with and without hydrogen injection as
a function of temperature.
Fig. 3. Constant voltage versus constant current modes. The standby bias point is
at ($I_{air}$, $V_{air}$).
3. Bias-dependent Stability Characteristics
To investigate the stability of the sensor signal, two different bias modes were tested,
namely constant voltage and constant current bias modes. The sensor bias (i.e., standby
condition) and sensing points are depicted in Fig. 3 whose current–voltage characteristics correspond to those at 200$^{\circ}$C in Fig. 2(a). When the sensor is operated in the constant voltage bias mode, the output current
fluctuations as a function of the voltage bias fluctuation can be expressed by the
derivative function $\left(\frac{\partial V_{g a s}}{\partial I_{a i r}}\right)$ at
the sensing point ($I_{gas}, V_{air}$), which indicates the sensitivity with which
the output current varies with the voltage bias fluctuation. When the fluctuation
of the voltage supply is $\alpha V_{air}$, where is the fluctuation factor, the uncertainty
of the output current can be defined as Eq. (2).
Fig. 4. (a) Sensing repeatability characteristics of the fabricated Pd-functionalized
recessed AlGaN/GaN-on-Si diode-type hydrogen sensor measured at 200$^{\circ}$C using
a constant bias voltage of 2.6 V, (b) magnified time transient characteristics.
Fig. 5. (a) Sensing repeatability characteristics of the fabricated Pd-functionalized
recessed AlGaN/GaN-on-Si diode-type hydrogen sensor measured at 200$^{\circ}$C using
a constant current bias of 21 mA, (b) magnified time transient characteristics.
When the sensor is operated in the constant current bias mode, the output voltage
fluctuations as a function of the current bias fluctuation can be expressed by the
derivative function $\frac{\partial V_{gas}}{\partial I_{air}}$ at the sensing point
($V_{gas}, I_{air}$). When the fluctuation of the current supply is , the uncertainty
of the output voltage can be defined as Eq. (3).
The sensing repeatability tests were carried out at 200$^{\circ}$C with a hydrogen
concentration of 4% using the two different bias operation modes, i.e., constant voltage
and constant current operations. Hydrogen gas was first introduced for 5 s, then paused
for 55 s, and the process was again repeated for 30 min. The standby bias point used
for the repeatability tests was a bias voltage ($V_{air}$) of 2.6 V and bias current
($I_{air}$) of 21 mA.
Fig. 4(a) and (b) show the repeatability and magnified time transient characteristics measured
using a constant voltage bias of 2.6 V. The derivative value at the sensing point
for the constant voltage mode in Fig. 3 was obtained as $\frac{\partial V_{gas}}{\partial I_{air}}$ = 0.014~A/V, from which
the uncertainty was calculated to be 6.26${\alpha}$.
Fig. 5(a) and (b) show the repeatability and time transient characteristics measured using
a constant current bias of 21 mA. The derivative value at the sensing point for the
constant current mode in Fig. 3 was obtained as $\frac{\partial V_{gas}}{\partial I_{air}}$ = 66.67~V/A, from which
the uncertainty was calculated to be 3.92${\alpha}$.
Because the diode current has an exponential relationship with the voltage, the uncertainty
in the constant voltage mode is higher than that in the constant current mode. Indeed,
the constant current mode operation exhibited more stable output signal characteristics,
as seen from Fig. 4 and 5. The fluctuation of the output signal in the constant voltage mode was $\frac{\Delta
I_{g a s}}{\left|I_{g a s}-I_{a i r}\right|}$ = 0.05, whereas that in the constant
current mode was $\frac{\Delta V_{g a s}}{\left|V_{g a s}-V_{a i r}\right|}$ = 0.016.
Therefore, it is suggested that a constant current mode of operation can provide more
accurate detection of hydrogen concentrations.
IV. CONCLUSIONS
A Pd-functionalized hydrogen sensor was implemented using an AlGaN/GaN-on-Si heterojunction
diode and investigated under different operation conditions, namely constant voltage
and constant current bias modes. Since the diode current has an exponential relationship
with the voltage, small fluctuations in the bias voltage tend to result in large variations
in the output current. Therefore, it is suggested that a constant current bias mode
of operation is more stable than the constant voltage mode.
ACKNOWLEDGMENTS
This work was supported by Korea Electric Power Corporation (Grant: R18XA02) and Basic
Science Research Programs (2015R1A6A1A03031833, 2016R1D1A1B03935445) through the National
Research Foundation of Korea (NRF).
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Author
June-Heang Choi received B.S. degree in Materials Science & Engineering / Department
of Chemical Engineering from Hongik University in Seoul, Korea, in 2015.
He received M.S. degree in Electronic and Electrical Engineering from Hongik University,
Seoul, Korea, in 2018, respectively.
He is currently pursuing the Ph.D. degree at Hongik University.
His research interest is wide-bandgap semiconductor devices.
Hyungtak Kim received the B.S. degree in Electrical Engineering from Seoul National
University, Seoul, Korea and the M.S./Ph.D. degree in Electrical and Computer Engineering
from Cornell University, Ithaca, New York, U.S.A., in 1996 and 2003, respectively.
In 2007, he joined the school of electronic and electrical engineering at Hongik University,
Seoul, Korea and is currently a professor.
His research interests include the reliability physics of semiconductor devices and
those applications toward extreme environment electronics.
Prior to joining Hongik University, he spent 4 years developing CMOS devices and process
integration for DRAM technology as a senior engineer in the semiconductor R&D center
at Samsung Electronics, Co. Ltd.