YangHeehun1
ParkJiho1
LeeJooseung1
OhHui-Myoung1
LeeSoonwoo1
YooHoyoung1
-
(Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea)
Copyright © The Institute of Electronics and Information Engineers(IEIE)
Index Terms
Field programmable gate array, ring oscillator, true random number generator, physically unclonable function
I. INTRODUCTION
Secure digital systems require the development of robust and reliable hardware-based
security mechanisms to counter the increasingly complex cyber security threats. True
Random Number Generators (TRNGs) and Physical Unclonable Functions (PUFs) have been
recognized as crucial components of such mechanisms [1,2]. TRNGs are essential for generating unpredictable random numbers for cryptographic
applications, while PUFs provide each physical hardware device with a unique and immutable
identifier, ensuring the trustworthiness for hardware. More precisely, a TRNG generates
unpredictable numbers by harnessing the intrinsic physical properties as entropy sources.
For example, representative TRNGs provide security utilizing entropy sources like
the metastable states of Flip-Flops [3,4], SRAM [5,6], and the clock jitter of Ring-Oscillators (ROs) [7,8]. On the other hand, a PUF offers unique identification by capitalizing on the minute,
uncontrollable variations inherent in the manufacturing process of hardware components.
PUFs generate secure cryptographic keys through distinct challenge-response pairs,
with various implementations such as RO PUFs [9,10], arbiter PUFs [11], and SRAM PUF [12].
Recently, there has been a focus on combining True Random Number Generators (TRNGs)
with Physical Unclonable Functions (PUFs) in order to develop a more efficient and
compact architecture. The integrated structures provide advantages in terms of both
area and power efficiency as compared to individual implementations [13-18]. These advantages are further enhanced when the hardware source used for TRNG and
PUF is same. [16] was the first to integrate a TRNG and PUF. [16] achieved this by using a Ring Oscillator as the hardware source to create the TRNG
and then successively producing the PUF. It was noticeable for proposing a unified
structure based on RO for the first time, but there are difficulties in operating
both TRNG and PUF simultaneously due to their sequential operation. Following on,
[17] and [19] introduced structures that could provide outputs for both TRNG and PUF at the same
time. Like [16], these systems rely on RO, where a part of the produced bits is used as a TRNG and
another piece as a PUF. This resolved the difficulty of generating bits at the same
time, but also introduced a deterioration in the performance by dividing the generated
bits for use.
Therefore, this paper presents a compact and versatile TRNG-PUF structure that achieves
superior performance for both TRNG and PUF functionalities. In contrast to previous
structures that utilized standard Ring Oscillators (RO), we have deployed a RO based
on Programmable Delay Logic (PDL) to exploit the entropy source of the True Random
Number Generator (TRNG) and the identification for the Physically Unclonable Function
(PUF). Furthermore, PDL-based RO improves TRNG and PUF performance by accurately adjusting
the PDLs. The subsequent sections of this work are structured as follows: Section
2 provides a comprehensive overview of RO-based TRNG and PUF structures, and Section
3 presents the proposed dual-mode TRNG-PUF structure using PDL-based ROs. Section
4 assesses the effectiveness of the proposed structure, while Section 5 provides the
last remarks of the paper.
II. BACKGROUND
1. Ring Oscillator(RO)
This section will begin by providing an overview of the fundamental functioning of
a ring oscillator (RO). Subsequently, it will outline the configurations of typical
RO-based TRNG and RO-based PUF. As shown in Fig. 1, a ring oscillator is a circuit consisting of an odd number of inverters, where the
output of the last inverter is connected back to the input of the first inverter,
forming a closed-loop configuration. In a standard ring oscillator, each inverter
inverts the incoming signal, and therefore an odd number of inverters in a closed
loop can create oscillatory behavior. The oscillation frequency or period is dictated
by the internal delay of the inverters and the number of inverters in place. Ideally,
all ROs would exhibit identical periods, but in practice, various factors such as
the circuit’s propagation delay, noise, thermal variations, and power supply variations
induce slight deviations from the ideal period, known as jitter [20]. It is noteworthy that this jitter inherent in ROs is harnessed as an entropy source
for RO-based TRNGs. Furthermore, while it may be expected that multiple identical
implementations of a RO would inherently operate at the same frequency, variations
in hardware implementation lead to differences, and each independently operating RO
will possess unique frequency characteristics. Due to the independent nature of the
hardware, the properties of each inverter may vary depending on its own physical characteristics.
Fig. 1 highlights the fact that a set of n ring oscillators have a unique frequency in practical
applications. It is essential to employ the physically unclonable distinctive attribute
of RO-PUFs.
Fig. 1. Ring-Oscillator (RO).
2. RO-based TRNG
Fig. 2 depicts a typical RO-based TRNG as described in [21], where it consists of ring oscillators, D-FFs and XOR tree. First, the fundamental
element of RO-based TRNG is the ring oscillator, gives rise to an oscillating signal
with a certain frequency. The uniqueness of this setup lies in the jitter, which is
the minute fluctuations in the oscillation frequency and period caused by a multitude
of factors, such as thermal noise, supply voltage variations, and process imperfections
during manufacturing. This inherent jitter is unpredictable and non-repeatable, making
it an excellent source of entropy for random number generation. Secondly, the oscillating
signal produced by the RO is sampled at discrete intervals using a D-Flip Flop, which
is controlled by a stable reference clock. By sampling this jittery signal, we capture
its randomness and convert it into a stream of random bits. However, the randomness
extracted from a single RO may not be sufficient to achieve the desired level of entropy
required for cryptographic applications. To address this, multiple ROs are employed,
each functioning independently and contributing its own unique jitter characteristics
to the overall entropy pool. Lastly, the outputs from these various ROs are then fed
into an XOR tree that combines the sampled bits. This process of aggregation not only
increases the overall entropy but also helps in mitigating any potential biases or
patterns that might be present in the output of a single RO, thus enhancing the randomness
of the final output.
Fig. 2. Typical RO-based TRNG.
3. RO-based PUF
Fig. 3 depicts a structure of RO-based PUF, where it produces a physically unclonable response
when presented with a challenge input. A typical RO-based PUF is implemented using
ring oscillators, counters, and a compactor. Each RO in this configuration has the
role of producing a unique frequency. Each RO in this configuration has the function
of producing a unique frequency. The uniqueness of each RO arises from the disparity
between ideal condition and realistic implementation. Under ideal condition, it can
be expected that the outputs of all the n ROs would be identical. However, the outputs
of ROs in practical situations differ due to the independent physical nature of the
circuitry. In a situation where n ROs possess independent frequencies, the challenge
input is responsible for selecting two out of these n ROs. The frequencies of the
selected RO pairs are counted using pairs of counters, and the resulting values are
compared by the compactor. Finally, this comparison results in a binary response of
either 0 or 1, depending on the outcome of the comparison. It is highly noteworthy
that the response varies for each hardware due to the minute differences in hardware
characteristics, similar to the individuality of a human fingerprint, which represents
the distinct nature of each hardware device.
Fig. 3. Block diagram of the proposed transmitter.
III. PROPOSED TRNG-PUF
In this section, we introduce a compact and versatile TRNG-PUF structure that demonstrates
improved performance for both TRNG and PUF functionalities. Diverging from conventional
designs that employ standard RO, we utilize a RO that has been developed with Programmable
Delay Logic (PDL). It enables us to effectively harness the entropy source essential
for TRNG and facilitates the unique identification capabilities for PUF. Initially,
we delve into the principles of PDL, followed by an in-depth explanation of the intricate
architecture of our proposed TRNG-PUF system based on PDL. First, we explore the fundamental
principles of PDL. Then, we provide a detailed explanation of the proposed TRNG-PUF
based on PDL
1. Programmable Delay Logic (PDL)
Recently, Programmable Delay Logic (PDL) has been widely applied in various security
implementations due to its ability to adjust the delay of logic gates. For example,
when implementing a RO as depicted in Fig. 1, we can use a PDL-based NOT gate instead of a conventional NOT gate, which enables
fine-tuning of the delay for each individual gate, allowing for greater optimization
in hardware configuration. Typically, PDL logic is predominantly implemented in Field
Programmable Gate Arrays (FPGAs). When constructing logic elements in FPGAs, Look-Up
Tables (LUTs) are mainly used, as illustrated in Fig. 4. A LUT in a FPGA consists of SRAM, which holds logic configuration information, and
a MUX tree that determines the output. Depending on the values stored in the SRAM,
the LUT can perform various logical operations such as AND, OR, NOT, etc. Fig. 4 demonstrates an example of implementing a NOT gate, where the configuration of a
6-input LUT performs the operation $O=\overline{I_{0}}$. In this configuration, when
the input I$_{0}$ is set to 0, the output O is consistently 1. Conversely, when I$_{0}$
is set to 1, the output O is consistently 0. This behavior is determined by the SRAM
and MUX. Furthermore, inputs I$_{1}$ to I$_{5}$ are utilized to program a delay of
the NOT gate. In this 6-input LUT, selections from {I$_{1}$, I$_{2}$, I$_{3}$, I$_{4}$,
I$_{5}$} = 5'b00000 to 5'b11111 are possible. The values chosen by the PDL do not
alter the logical value of the output, but they can adjust the paths within the LUT,
as depicted in Fig. 4. When PDL is applied to the conventional RO in Fig. 1, standard NOT gates can be substituted with PDL-based NOT gates. By utilizing these
path variations, the characteristics of PDL allow for the fine-tuning of the RO.
Fig. 4. Programmable Delay Logic (PDL).
2. Detailed Proposed Design
Fig. 5 illustrates the PDL-RO-based TRNG-PUF structure proposed in this paper. Unlike previous
TRNG-PUF structures [16,17] that used conventional ROs, we employ PDL-based ROs to achieve superior performance
and provide a parallel channel to enable the simultaneous operation of TRNG and PUF.
The proposed design consists of n sets of ROs and circuits for TRNG and PUF with the
use of shared ROs. The shared PDL-based ROs serve as a source of entropy based on
jitter in TRNG mode, and offer distinct frequencies in PUF mode.
Fig. 5. Proposed PDL-RO-based TRNG-PUF design.
To elaborate, in our proposed TRNG-PUF structure, TRNG generation operates as follows:
At first, the PDL-based RO produces an oscillating signal with unique frequency variations,
known as jitter, due to factors like thermal noise and manufacturing process. The
proposed TRNG-PUF offers superior jitter optimization by using PDL-based ROs compared
to the previous TRNG-PUFs. The subsequent steps are similar to the standard TRNG procedures
as shown in Fig. 2. The oscillating signal is first sampled using a D-Flip Flop and then merged using
an XOR tree, generating random bits. Furthermore, in our proposed TRNG-PUF structure,
PUF generation operates as follows: At first, the PDL-based ROs are used to generate
distinct frequencies. Since the PDL-based RO can adjust each delay, the PDL-based
RO has the capability to regulate the generation of different frequencies in order
to maximize the performance of PUF, which is not possible with a regular RO. The subsequent
process is similar to typical PUF operations as shown in Fig. 3, where a challenge selects ROs, followed by counting and comparison to generate the
PUF response.
Consequently, our proposed structure utilizes shared PDL-based ROs for both TRNG and
PUF, employing them as an entropy source and for their independent hardware characteristics,
leading to an area-efficient design. Additionally, by implementing PDL-based ROs instead
of standard ROs, we provide better quality sources for TRNG and PUF, resulting in
enhanced performance. It is logical that PDL-based ROs, being capable of fine-tuning
in response to the various variations in FPGA, are expected to outperform standard
ROs, which are set arbitrarily during the place and route process. Finally, by implementing
TRNG and PUF structures in parallel, it becomes feasible to achieve simultaneous operation
through a single PDL-based RO, contributing to overall system performance enhancement.
IV. EXPERIMENTAL RESULTS
In order to verify the advantages of the proposed structure, the proposed TRNG-PUF
structure is implemented on a Xilinx Artix-7 100T FPGA using the Xilinx Vivado 2020.2
EDA tool. Fig. 6(a) displays the results of implementing the proposed TRNG-PUF, and Fig. 6(b) illustrates the detailed implementation of the PDL-based RO. As shown in Fig. 6(b), the proposed TRNG-PUF design utilizes 32 ROs, each consisting of 5 inverters and
1 AND gate.
Fig. 6. (a) Proposed TRNG-PUF implementation; (b) Proposed PDL-RO implementation.
The PDL-based ring oscillator offers the flexibility to finely adjust to a variety
of environmental factors, such as temperature shifts, voltage changes, and noise,
thereby optimizing or maximizing the performance of TRNGs and PUFs. Hence, setting
the inputs for the PDL is a critical factor for the proposed TRNG-PUF design. For
experiments, we first screened potential candidates based on TRNG performance from
all combinations of PDL settings. Then, from those satisfying our TRNG performance
criteria, we selected the final PDL input configuration that provided the highest
PUF performance. As a result, we were able to select a PDL input that ensures superior
performance for both TRNG and PUF.
1. Hardware Complexity
Table 1 compares the hardware complexity of various TRNG-PUF structures, including conventional,
previous [16], previous [17,18] and the proposed structure. The conventional structure refers to an arrangement where
TRNG as shown in Fig. 2 and PUF as shown in Fig. 3 are implemented separately without hardware sharing. Previous [16] represents the first RO-based TRNG-PUF structure, while previous [17,18] signifies a structure that achieves TRNG-PUF by splitting counting bits. The proposed
TRNG-PUF shown in Fig. 5, unlike previous structures that use standard RO, utilizes and shares PDL-based ROs.
Note that we implemented both the conventional and proposed structures on Xilinx Artix7,
and the results for previous structures were extracted from [16-18]. Experimental results indicate that the proposed TRNG-PUF is the most area-efficient
structure by sharing PDL-based ROs. The proposed TRNG-PUF structure shares PDL-based
ROs, exploiting them as an entropy source for TRNG and as unique hardware nature for
PUF, respectively. Compared to the conventional structure without shared sources,
the proposed design reduced the area of LUT and flip-flops by 41% and 24%, respectively.
Table 1. Hardware complexity comparison
Metric
|
Conventional
|
Proposed
|
Improvement*
|
FPGA
|
Artix-7
|
Artix-7
|
-
|
LUT
|
547(LUT6)
|
323(LUT6)
|
40.95%
|
FF
|
133
|
101
|
24.06%
|
Slice
|
171
|
111
|
35.09%
|
*Improvement = (Conv. - Proposed) / Conv.
2. TRNG Performance
To assess the performance of the TRNG, we carried out the NIST SP 800-22 test [22]. We conducted the NIST SP 800-22 test by performing 100 iterations using 1,000,000-bit
bitstreams, resulting in a total of 100,000,000 random number bits created. Table 2 shows the results of the NIST SP 800-22 test. The NIST SP 800-22 test consist of
15 comprehensive tests designed to assess the level of randomness. The P value is
a statistical measure that quantifies the likelihood of obtaining results, and the
proportion indicates the ratio of passing the test. If the P-value exceeds 0.01 and
the percentage is more than 0.96, the NIST SP 800-22 classifies the bitstream as compatible
with TRNG standards. According to experimental results, while the previous TRNG-PUF
[18] failed to pass all the tests, the proposed TRNG-PUF successfully passed all 15 tests.
This can be attributed to the to the optimization of randomness by adjusting the parameters
of PDL and and using parallel processing of TRNG and PUF structures, resulting in
no influence on the performance of either TRNG or PUF.
Table 2. TRNG performance comparison (NIST SP 800-22)
Statistical test
|
Previous [18]
|
Proposed
|
P-Value
|
Proportion
|
P-Value
|
Proportion
|
Frequency
|
-
|
0.53
|
0.68
|
1.00
|
BlockFrequency
|
-
|
0.85
|
0.13
|
0.96
|
CumulativeSums
|
-
|
0.54
|
0.71
|
0.99
|
Runs
|
-
|
0.81
|
0.40
|
0.99
|
LongestRun
|
-
|
0.97
|
0.44
|
0.97
|
Rank
|
-
|
0.99
|
0.30
|
0.99
|
FFT
|
-
|
0.98
|
0.99
|
0.99
|
NonOverlappingTemplate
|
-
|
0.85
|
0.51
|
0.99
|
OverlappingTemplate
|
-
|
0.91
|
0.37
|
1.00
|
Universal
|
-
|
0.98
|
0.35
|
0.99
|
ApproximateEntropy
|
-
|
0.94
|
0.68
|
0.97
|
RandomExcursions
|
-
|
0.97
|
0.39
|
0.99
|
RandomExcursionVariant
|
-
|
0.97
|
0.36
|
0.99
|
Serial
|
-
|
0.97
|
0.24
|
0.98
|
LinearComplexity
|
-
|
1.00
|
0.98
|
0.99
|
TRNG Performance
|
Partial Pass(10/15)
|
Complete Pass(15/15)
|
3. PUF Performance
PUFs are characterized by their uniqueness, reproducibility, and randomness, and this
paper assesses uniqueness through inter Hamming distance (HD$_{inter}$,) reproducibility
through intra Hamming distance (HD$_{intra}$,) and randomness through the autocorrelation
function (ACF). Note that the Hamming Distance quantifies the disparity in bits between
two bitstreams. We computed HD$_{inter}$, which measures the performance of the PUF
across several FPGAs, and HD$_{intra}$, which measures the performance of the PUF
within the same FPGA. The values of HD$_{inter}$ and HD$_{intra}$ can be calculated
as
!-- disp-formula -->
where N and I denote the quantity of devices and the number of iterations, respectively.
Meanwhile, k represents the overall length of the response bits. R$_{i}$, R$_{j}$,
and R$_{F}$ refer to the i-th and j-th response bits, as well as the reference response
bit, respectively. It is important to note that HD$_{inter}$ value of 50% indicates
the optimal performance, meaning that separate PUFs are generated independently regardless
of the FPGA, while HD$_{intra}$ value of 0% indicates that independent PUF performance
is achieved within the same FPGA over several iterations. Table 3 presents a comparison of the performance of PUFs among different designs. A total
of 200,000,000 responses were generated for all challenges in order to calculate the
Hamming distance. According to experimental results, the proposed TRNG-PUF achieved
an HD$_{inter}$ of 49.93% and an HD$_{intra}$ of 4.17%. Compared to previous TRNG-PUF
structures, it demonstrates superior performance in HD$_{inter}$ and nearly similar
levels in HD$_{intra}$.
Furthermore, to verify the randomness of the extracted PUF bits, we calculate the
ACF as (3) similar to [15].
where T is the length of the bits, $\mu $ is the mean, $\sigma $ represents the variance,
y$_{t}$ is the bit at position t, and k denotes the lag. Fig. 7 shows the results of the ACF test for the extracted PUF bits. The experimental results
demonstrate that the extracted bits are distributed within the 95% confidence interval
(CI) value of 0.0620, indicating no significant autocorrelation. As a result, the
proposed design is capable of generating a PUF bitstream with high levels of uniqueness,
reproducibility, and randomness.
Fig. 7. Autocorrelation test result.
Table 3. PUF performance comparison
Metric
|
Previous [16]
|
Previous [17]
|
Proposed
|
HDInter
|
42.80 %
|
49.15 %
|
49.93 %
|
HDIntra
|
19.40 %
|
2.05 %
|
4.17 %
|
Performance*
|
0.01
|
0.57
|
3.43
|
*Performance = 1 / (|HD$_{inter}$-50|xHD$_{intra}$)
V. CONCLUSIONS
In this paper, we introduce a new TRNG-PUF structure using PDL-based ROs. This novel
design distinguishes itself from the previous designs by using PDL for precise adjustment
of ROs. It enables us to effectively harness the entropy source essential for TRNG
and facilitates the unique identification capabilities for PUF. Our structure is successfully
implemented and evaluated on a Xilinx Artix-7 100T FPGA. According to experimental
results, it shows significant reduction in area by sharing the PDL-based ROs. In addition,
The proposed TRNG-PUF structure successfully pass all 15 tests of the NIST SP 800-22
standard, outperforming previous designs that only achieved partial success. This
highlights its robustness in generating truly random numbers. Lastly, the performance
of the PUF is evaluated using Hamming distance measures, demonstrating its excellent
performance. It emphasize the reliability and uniqueness of our PUF responses. As
a result, the proposed TRNG-PUF design can be a potential candidate as an efficient
and secure solution in the realm of hardware-based cryptography.
ACKNOWLEDGMENTS
This research was supported by Korea Electrotechnology Research Institute (KERI)
Primary research program through the National Research Council of Science & Technology
(NST) funded by the Ministry of Science and ICT (MSIT) (No. 24A01045)
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Heehun Yang received the B.S. degree in electronics engineering from Chungnam
National University, Daejeon, South Korea, in 2020, where he is currently working
toward the M.S. degree. His current research interests include embedded systems hardware
security, evaluation of true random number generators and physical unclonable functions
aimed at cryptographic applications, FPGA platform, VLSI for DSP.
Jiho Park received the B.S. degree in electronics engineering from Chungnam National
University, Daejeon, South Korea, in 2023, where he is currently working toward the
M.S. degrees. His current interests include embedded systems hardware security, evaluation
of true random number generators and physical unclonable functions aimed at cryptographic
applications.
Jooseung Lee received the B.S. degree in electronics engineering from Sogang University,
Seoul, South Korea, in 2014, and the M.S. degree in electrical engineering from Korea
Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea, in 2016.
Since 2019, he has been with the Power Grid Research Division, Korea Electrotechnology
Research Institute (KERI). Prior to joining KERI, he was with Samsung Electronics,
Hwasung, South Korea, where he was involved in the research of NAND flash memories
controllers. His current research interests include algorithms and implementations
for smart grids and electric vehicle charging systems.
Hui-Myoung Oh received the B.S. degree in electrical engineering from the Yonsei
University, Seoul, South Korea in 1998, and the M.S. and the Ph.D. degrees in electrical
and electronic engineering from the same university in 2000 and 2009, respectively.
He was a researcher in the Korea Electrotechnology Research Institute (KERI) from
2001 to 2005 and a senior researcher from 2006 to 2015, and has been working as a
principal researcher in the same institute since 2016. His research interests include
digital communication systems, digital twin systems, EV communication protocols, and
smart grids based on renewable energy.
Soonwoo Lee received his Ph.D degrees in mechatronics engineering from Korea University,
Seoul, South Korea in 2018. He has been with the Korea Electrotechnology Research
Institute (KERI) since 2005 and is currently a principal researcher in the Power ICT
Center. His research interests include signal processing, digital control, and digital
circuit design for power utility and smart grid applications.
Hoyoung Yoo received the B.S. degree in electrical and electronics engineering
from Yonsei University, Seoul, South Korea, in 2010, and the M.S., and Ph.D. degrees
in electrical engineering from Korea Advanced Institute of Science and Technology
(KAIST), Daejeon, South Korea, in 2012 and 2016, respectively. Since 2016, he has
been with the Department of Electronics Engineering, Chungnam National University
(CNU), Daejeon, where he is currently an Associate Professor. Prior to joining CNU,
in 2016, he was with Samsung Electronics, Hwasung, South Korea, where he was involved
in the research of nonbinary LDPC decoders for NAND flash memories. His current research
interests include algorithms and architectures for errorcorrecting codes, FPGA reverse
engineering, GNSS communication, and 5G communication systems.