Mobile QR Code QR CODE : Journal of the Korean Institute of Illuminating and Electrical Installation Engineers

Journal of the Korean Institute of Illuminating and Electrical Installation Engineers

ISO Journal TitleJ Korean Inst. IIIum. Electr. Install. Eng.

  1. (Ph.D. course, Department of Electrical Engineering, Chungbuk National University, Korea)
  2. (Master course, Department of Electrical Engineering, Chungbuk National University, Korea)



Bio-epoxy composites, Epoxidized soybean oil (ESO), Statistical analysis

1. ์„œ ๋ก 

1.1. ์—ฐ๊ตฌ์˜ ํ•„์š”์„ฑ

๊ณ ์ „์•• ์ „๋ ฅ์„ค๋น„์˜ ์ ˆ์—ฐ์„ ์œ„ํ•ด์„œ ์‚ฌ์šฉ๋˜๋Š” ์ ˆ์—ฐ๋ฌผ์€ ์šฐ์ˆ˜ํ•œ ์ ˆ์—ฐ ํŠน์„ฑ, ๋‚ด์—ด์„ฑ ๋ฐ ํ™”ํ•™์  ์•ˆ์ •์„ฑ์„ ์ง€๋‹Œ ์—ํญ์‹œ ์ˆ˜์ง€์ด๋‹ค[1]. ์ด๋Ÿฌํ•œ ์—ํญ์‹œ ์ˆ˜์ง€๋Š” ์—ด๊ฒฝํ™”์„ฑ(Thermosetting)์œผ๋กœ ๊ณ ์˜จ ํ™˜๊ฒฝ์— ๋…ธ์ถœ๋˜๋Š” ๊ฒฝ์šฐ ํƒ„์†Œ ๋ถ€์‚ฐ๋ฌผ์„ ๋ฐฐ์ถœํ•˜์—ฌ ํ™˜๊ฒฝ ์˜ค์—ผ ๋ฌธ์ œ๋ฅผ ์œ ๋ฐœํ•œ๋‹ค. ๋”ฐ๋ผ์„œ ์ด๋Ÿฌํ•œ ๋ฌธ์ œ๋ฅผ ํ•ด๊ฒฐํ•˜๊ธฐ ์œ„ํ•ด ๋…ธ๋ ฅํ•˜๊ณ  ์žˆ๋‹ค.

์žฌํ™œ์šฉ ๋ถˆ๊ฐ€ํ•œ ๊ธฐ์กด์˜ ์„์œ ๊ณ„ ์—ํญ์‹œ ์ˆ˜์ง€์— ์žฌ์‚ฌ์šฉํ•  ์ˆ˜ ์žˆ๋Š” ์นœํ™˜๊ฒฝ ์ˆ˜์ง€๋ฅผ ํ˜ผํ•ฉํ•˜์—ฌ ์ˆ˜์ง€ ๋ชจ์ฒด(Matrix)๋กœ ํ™œ์šฉํ•˜๋ ค๊ณ  ์‹œ๋„ํ•˜๊ณ  ์žˆ๋‹ค. ํŠนํžˆ, ๋Œ€๋‘์œ , ์˜ฅ์ˆ˜์ˆ˜์œ  ๋“ฑ ์‹๋ฌผ์„ฑ ๊ธฐ๋ฆ„์„ ๊ธฐ์กด ์ˆ˜์ง€์— ํ•ฉ์„ฑํ•˜๋ ค๋Š” ์‘์šฉ์—ฐ๊ตฌ๊ฐ€ ๊ตญ๋‚ด์™ธ๋กœ ํ™œ๋ฐœํžˆ ์ง„ํ–‰๋˜๊ณ  ์žˆ๋‹ค. ๋‹ค์–‘ํ•œ ์‹๋ฌผ์„ฑ ๊ธฐ๋ฆ„ ์ค‘์—์„œ ์—ํญ์‹œํ™” ๋Œ€๋‘์œ (ESO: Epoxidized Soybean Oil)๊ฐ€ ๊ฒฝ์ œ์„ฑ ์ธก๋ฉด์—์„œ ์ €๋ ดํ•˜๊ณ , ์œ ์—ฐํ•˜๊ณ  ๊ธด ๋ถ„์ž ์‚ฌ์Šฌ์˜ ํ™”ํ•™์  ๊ตฌ์กฐ๋ฅผ ๊ฐ€์ง€๋ฏ€๋กœ ์ฃผ๋ชฉ๋ฐ›๊ณ  ์žˆ๋‹ค. ๋˜ํ•œ, ์„์œ ๊ณ„ ์—ํญ์‹œ ์ˆ˜์ง€์™€ ํ˜ผํ•ฉํ•˜๋ฉด ์ ๋„๋ฅผ ๋‚ฎ์ถ”๊ณ , ๊ฐ€์†Œ์ œ ์—ญํ• ์ด ๊ฐ€๋Šฅํ•ด ์—ํญ์‹œ ์ˆ˜์ง€๊ฐ€ ์ง€๋‹Œ ์ทจ์„ฑ(Brittleness)์ด ์•ฝํ•œ ๋ฌธ์ œ๋ฅผ ํ•ด๊ฒฐํ•  ์ˆ˜ ์žˆ๋‹ค.

์„ ํ–‰์—ฐ๊ตฌ [2]๋Š” ์„์œ ์ž์› ๊ธฐ๋ฐ˜์˜ ๊ธฐ์กด ์—ํญ์‹œ ์ˆ˜์ง€(DGEBA: Diglycidyl Ether of Bisphenol A)์™€ ESO๋ฅผ ๋‹ค์–‘ํ•œ ๋น„์œจ๋กœ ํ˜ผํ•ฉํ•˜์—ฌ ์ œ์ž‘๋œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ์ˆ˜์ง€์˜ ๊ธฐ๊ณ„์  ํŠน์„ฑ๊ณผ ์—ด์  ํŠน์„ฑ์„ ๋ถ„์„ํ•˜์˜€๋‹ค. ESO ์ˆ˜์ง€์˜ ํ•จ๋Ÿ‰๋น„๊ฐ€ 30 wt%๊นŒ์ง€ ์ฆ๊ฐ€ํ•จ์— ๋”ฐ๋ผ์„œ ์—ด์  ์•ˆ์ •์„ฑ์˜ ๋ฏธ์„ธํ•œ ๋ณ€ํ™”์™€ ๊ธฐ๊ณ„์  ํŠน์„ฑ์˜ ๊ฐœ์„ ์„ ํ™•์ธํ•˜์˜€๋‹ค. ๋˜ํ•œ, Hong et al. [3]์€ ESO๋กœ ๊ฐœ์งˆ๋œ ์—ํญ์‹œ ์ˆ˜์ง€์˜ ํŠน์„ฑ์œผ๋กœ ์—ด์ /๊ธฐ๊ณ„์  ๋ฌผ์„ฑ๋ฟ๋งŒ ์•„๋‹ˆ๋ผ, SEM ์ด๋ฏธ์ง€ ๋ถ„์„์„ ํ†ตํ•ด ESO ํ•จ๋Ÿ‰ ์ฆ๊ฐ€์— ๋”ฐ๋ฅธ ๋ชจํด๋กœ์ง€ ๋ณ€ํ™”๋ฅผ ํ™•์ธํ•˜์˜€๋‹ค.

์ตœ๊ทผ์—๋Š” ๋ฐฐ์ „์šฉ ์ค‘์ „๊ธฐ๊ธฐ์— ์ ์šฉํ•˜๊ธฐ ์œ„ํ•ด ์ „๊ธฐ์  ํŠน์„ฑ์„ ๋ถ„์„ํ•œ ์—ฐ๊ตฌ๋„ ์žˆ๋‹ค. Jeon et al. [4]์€ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ์ˆ˜์ง€์— ์ „๊ธฐ์  ์ ˆ์—ฐ์„ฑ ๋ฐ ๊ธฐ๊ณ„์  ํŠน์„ฑ์ด ์šฐ์ˆ˜ํ•ด ์ „๋ ฅ์„ค๋น„ ์—ํญ์‹œ ์ ˆ์—ฐ๋ฌผ์— ์ฃผ๋กœ ์ฒจ๊ฐ€๋˜๋Š” ํ‘œ๋ฉด์ด ๊ฐœ์งˆ๋˜์ง€ ์•Š์€ ๋งˆ์ดํฌ๋กœ ์‹ค๋ฆฌ์นด(SiOโ‚‚) 65 wt%๊ฐ€ ํ•จ์œ ๋œ ๋ณตํ•ฉ์ฒด๋ฅผ ์ œ์กฐํ•˜์—ฌ, HVAC ์ ˆ์—ฐ๋‚ด๋ ฅ๊ณผ ์ฃผํŒŒ์ˆ˜ ๋ณ€ํ™”์— ๋”ฐ๋ฅธ ์œ ์ „์œจ, ์œ ์ „์†์‹ค, ์ „๊ธฐ์ „๋„๋„๋ฅผ ํ‰๊ฐ€ํ•˜์˜€๋‹ค.

์ด์ฒ˜๋Ÿผ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด๋ฅผ ์ „๋ ฅ์„ค๋น„ ์ ˆ์—ฐ๋ฌผ๋กœ ์ ์šฉํ•˜๊ธฐ ์œ„ํ•ด์„œ ๋‹ค์–‘ํ•œ ์„ฑ๋Šฅ์„ ๊ฒ€์ฆํ•˜๊ณ  ์žˆ๋‹ค. ํ•˜์ง€๋งŒ ๋Œ€๋ถ€๋ถ„์˜ ์—ฐ๊ตฌ๋Š” ์—ด์  ํŠน์„ฑ๊ณผ ๊ธฐ๊ณ„์  ํŠน์„ฑ ๋ถ„์„ ๊ฒฐ๊ณผ๋ฅผ ๋ณด๊ณ ํ•˜๊ณ  ์žˆ์œผ๋ฉฐ, ์ „๊ธฐ์  ์ ˆ์—ฐ ํŠน์„ฑ์— ๋Œ€ํ•œ ์—ฐ๊ตฌ ๊ฒฐ๊ณผ๋Š” ์ƒ๋Œ€์ ์œผ๋กœ ์ œํ•œ๋œ ์‹ค์ •์ด๋‹ค.

1.2. ์—ฐ๊ตฌ์˜ ๋ชฉ์  ๋ฐ ๋ฐฉ๋ฒ•

ํƒ„์†Œ ๋ฐฐ์ถœ๋Ÿ‰ ์ €๊ฐ์„ ์œ„ํ•ด์„œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด๋ฅผ ์ „๋ ฅ์„ค๋น„ ์ ˆ์—ฐ๋ฌผ๋กœ ์ ์šฉํ•  ์ˆ˜ ์žˆ๋„๋ก ์ „๊ธฐ์  ์ ˆ์—ฐ ์ˆ˜๋ช…์„ ๋ถ„์„ํ•˜๊ณ ์ž ํ•œ๋‹ค. IEC(International Electro technical Commission) ๊ทœ๊ฒฉ์„ ๊ธฐ๋ฐ˜์œผ๋กœ ํ•˜์—ฌ, ๋ฐ”์ด์˜ค ์—ํญ์‹œ์˜ ์ „๊ธฐ์  ํŠน์„ฑ(์œ ์ „์œจ, ์œ ์ „์†์‹ค, ์ „๊ธฐ์ „๋„๋„)๊ณผ AC ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐ๋‚ด๋ ฅ์„ ํ‰๊ฐ€ํ•˜์˜€๋‹ค. ๊ฐ€์†์—ดํ™”์‹œํ—˜(AST: Accelerated Stress Test)์„ ํ†ตํ•ด ์žฅ์‹œ๊ฐ„ ์—ดํ™”์— ๋”ฐ๋ฅธ ์ ˆ์—ฐ์„ฑ๋Šฅ ๋˜ํ•œ ํ‰๊ฐ€ํ•˜์˜€๋‹ค.

AC ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐ๋‚ด๋ ฅ๊ณผ ์ ˆ์—ฐ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ๋Š” ํ†ต๊ณ„์  ๋ถ„ํฌ๋ฅผ ํ™œ์šฉํ•˜์—ฌ ๋ถ„์„ํ•˜์˜€๋‹ค. ์‹คํ—˜ ๋ฐ์ดํ„ฐ์˜ ๋ถ„์‚ฐ์„ฑ ๋“ฑ์„ ํ™•์ธํ•˜๊ธฐ ์œ„ํ•ด์„œ ์ •๊ทœ ๋ถ„ํฌ ๋ฒ•์น™์„ ๋งŒ์กฑํ•˜๋Š”์ง€ ํ™•์ธํ•˜์˜€๊ณ , ๊ณ ์ „์•• ๋ถ„์•ผ์—์„œ ๋งŽ์ด ์‚ฌ์šฉ๋˜๋Š” ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ, Weibull ๋ถ„ํฌ, ์ง€์ˆ˜ ๋ถ„ํฌ, ๊ฐ๋งˆ ๋ถ„ํฌ๋ฅผ ํ™œ์šฉํ•˜์—ฌ ๋ถ„ํฌ ์ ํ•ฉ์„ฑ ๊ฒ€์ •์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ์ด๋ฅผ ํ†ตํ•ด, ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ ˆ์—ฐ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ ๋ถ„์„์— ๊ฐ€์žฅ ์ ํ•ฉํ•œ ํ†ต๊ณ„์  ๋ถ„ํฌ๋ฅผ ์„ ์ •ํ•˜๊ณ ์ž ํ•œ๋‹ค.

2. ํ†ต๊ณ„์  ๋ถ„์„ ๋ฐฉ๋ฒ•

2.1. ํ†ต๊ณ„์  ๋ถ„ํฌ ๋ถ„์„

์ผ๋ฐ˜์ ์œผ๋กœ ๊ณ ์ „์•• ์‹คํ—˜์€ ์‹œํ—˜ ์žฅ๋น„, ์˜จยท์Šต๋„ ํ™˜๊ฒฝ ๋“ฑ ๋‹ค์–‘ํ•œ ์š”์ธ์— ์˜ํ•ด์„œ ์‹คํ—˜ ๊ฒฐ๊ณผ๊ฐ€ ์ƒ์ดํ•ด์ง„๋‹ค[5]. ๋”ฐ๋ผ์„œ ๊ณ ์ „์•• ์‹คํ—˜ ๋ฐ์ดํ„ฐ๋Š” ํ†ต๊ณ„์  ๋ถ„ํฌ ๊ฒ€์ •์ด ์š”๊ตฌ๋œ๋‹ค[6, 7]. ๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด ์‹œํŽธ์˜ AC ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜๊ณ ์ž ์ •๊ทœ ๋ถ„ํฌ์™€ Weibull ๋ถ„ํฌ ๋ฒ•์น™์„ ๋”ฐ๋ฅด๋Š”์ง€ ํ™•์ธํ•˜์˜€๋‹ค.

์ •๊ทœ ๋ถ„ํฌ๋Š” ์ธก์ •๋œ ์‹คํ—˜๊ฐ’๋“ค์ด ์–ด๋–ป๊ฒŒ ๋ถ„ํฌํ•˜๋Š”์ง€ ๋‚˜ํƒ€๋‚ด๋Š” ํ™•๋ฅ  ํ•จ์ˆ˜๋กœ, ๊ด€์ธก์น˜์˜ ๋Œ€์นญ์„ฑ ํ™•์ธ์— ์œ ์šฉํ•œ ๋ถ„ํฌ์ด๋‹ค. ์ด ๋ถ„ํฌ์—์„œ ์ค‘์š”ํ•œ ๋ชจ์ˆ˜๋Š” ํ‰๊ท ๊ณผ ํ‘œ์ค€ํŽธ์ฐจ์ด๋‹ค. ์ •๊ทœ์„ฑ ๊ฒ€์ •์„ ์œ„ํ•ด์„œ Shapiro-Wilk[8], Kolmogorov-Smirnov[9] ๋ฐฉ๋ฒ•์„ ์‚ฌ์šฉํ•˜์˜€๋‹ค.

Shapiro-Wilk ๋ฐฉ๋ฒ•์€ ๊ด€์ธก์น˜๋“ค์ด ์ •๊ทœ ๋ถ„ํฌ๋ฅผ ๋”ฐ๋ฅด๋Š”์ง€ ํ‰๊ฐ€ํ•˜๋Š” ๊ฐ€์žฅ ์ผ๋ฐ˜์ ์ธ ๋ฐฉ๋ฒ•์ด๋‹ค. ํŠนํžˆ, ํ‘œ๋ณธ์˜ ํฌ๊ธฐ๊ฐ€ ์ž‘์€ ๊ฒฝ์šฐ ํšจ๊ณผ์ ์ด๋‹ค. Kolmogorov-Smirnov ๋ฐฉ๋ฒ•์€ ์ด๋ก ์  ๋ถ„ํฌ์™€ ๊ฒฝํ—˜์  ๋ˆ„์ ๋ถ„ํฌํ•จ์ˆ˜(ECDF: Empirical Cumulative Distribution Function)๋ฅผ ๋น„๊ตํ•˜์—ฌ ๊ด€์ธก์น˜ ๋ถ„์„์— ์‚ฌ์šฉ๋œ ๋ถ„ํฌ๋ฅผ ๋”ฐ๋ฅด๋Š”์ง€ ํ™•์ธํ•œ๋‹ค.

Weibull ๋ถ„ํฌ๋Š” ์„œ๋กœ ๋‹ค๋ฅธ ๋น„์œจ์—์„œ ์ ˆ์—ฐํŒŒ๊ดด๊ฐ€ ๋ฐœ์ƒํ•˜๋Š” ํ™•๋ฅ  ๊ฒฐ์ •์— ์œ ์šฉํ•˜๋ฉฐ, ์ „๋ ฅ์„ค๋น„ ๋˜๋Š” ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์ˆ˜๋ช… ์ถ”์ •์— ๋„๋ฆฌ ํ™œ์šฉ๋œ๋‹ค[10]. ์ด ๋ถ„ํฌ๋Š” ์ฒ™๋„ ๋ชจ์ˆ˜(Scale Parameter)์™€ ํ˜•์ƒ ๋ชจ์ˆ˜(Shape Parameter)๋ฅผ ๊ฐ€์ง€๋ฉฐ, ๋‘ ๋ชจ์ˆ˜๋ฅผ ํ™œ์šฉํ•˜์—ฌ ํ†ต๊ณ„์  ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•œ๋‹ค.

์ •๊ทœ ๋ถ„ํฌ ๋ฐ Weibull ๋ถ„ํฌ ๋ฒ•์น™ ๊ฒ€์ •์—์„œ ์‹ ๋ขฐ๊ตฌ๊ฐ„(CI: Confidence Interval)์€ 95%๋กœ ํ•˜์˜€๋‹ค. ๋”ฐ๋ผ์„œ, ๊ด€์ธก์น˜๊ฐ€ ๋‘ ๋ถ„ํฌ๋ฅผ ๋งŒ์กฑํ•˜๋Š”์ง€๋Š” ํ†ต๊ณ„์  ์œ ์˜์„ฑ์ธ p-value๋ฅผ ์œ ์˜์ˆ˜์ค€(Significance Level) 0.05์™€ ๋น„๊ตํ•˜์—ฌ ๊ฒฐ์ •ํ•˜์˜€๋‹ค. p-value โ‰ค 0.05์ธ ๊ฒฝ์šฐ, ๊ท€๋ฌด๊ฐ€์„ค(์ฆ‰, ๊ด€์ธก์น˜๊ฐ€ ์ •๊ทœ/Weibull ๋ถ„ํฌ๋ฅผ ๋”ฐ๋ฅธ๋‹ค๋Š” ๊ฐ€์„ค)์€ ๊ธฐ๊ฐ๋œ๋‹ค. ์ด๋Š” ์ธก์ •์น˜๊ฐ€ ๋ถ„ํฌ ๋ฒ•์น™์— ๋ถ€ํ•ฉํ•˜์ง€ ์•Š์Œ์„ ์˜๋ฏธํ•œ๋‹ค. ๋ฐ˜๋Œ€๋กœ, p-value > 0.05์ธ ๊ฒฝ์šฐ๋Š” ๊ท€๋ฌด๊ฐ€์„ค์ด ์ฑ„ํƒ๋˜๋ฉฐ, ์ด๋Š” ๊ด€์ธก์น˜๊ฐ€ ๋ถ„ํฌ ๋ฒ•์น™์„ ๋งŒ์กฑํ•จ์„ ์˜๋ฏธํ•œ๋‹ค.

2.2. ๋ถ„ํฌ ์ ํ•ฉ์„ฑ ๊ฒ€์ •

Anderson-Darling[11] ๋ฐฉ๋ฒ•์„ ์ด์šฉํ•˜์—ฌ AST์—์„œ ํš๋“ํ•œ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ ๋ถ„์„์— ์žˆ์–ด ๊ฐ€์žฅ ์ ์ ˆํ•œ ํ†ต๊ณ„์  ๋ถ„ํฌ ๋ชจ๋ธ์˜ ์œ ํšจ์„ฑ์„ ๊ฒ€ํ† ํ•˜์˜€๋‹ค. ๊ณ ์ „์•• ๊ณตํ•™ ๋ถ„์•ผ๋Š” ๊ณ ์žฅ ๋ฐ์ดํ„ฐ๋ฅผ ํ†ต๊ณ„ ๋ถ„์„ํ•  ๋•Œ ์ผ๋ฐ˜์ ์œผ๋กœ ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ, ์ง€์ˆ˜ ๋ถ„ํฌ, ๊ฐ๋งˆ ๋ถ„ํฌ, Weibull ๋ถ„ํฌ๊ฐ€ ์ ์šฉ๋œ๋‹ค[5]. ๋”ฐ๋ผ์„œ, ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ AST์—์„œ ๊ธฐ๋ก๋œ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ๋ฅผ ๋Œ€์ƒ์œผ๋กœ ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ, Weibull ๋ถ„ํฌ, ์ง€์ˆ˜ ๋ถ„ํฌ, ๊ฐ๋งˆ ๋ถ„ํฌ๋ฅผ ์‚ฌ์šฉํ•ด ๋ถ„์„ํ•˜๊ณ , ์ด ๊ณผ์ •์—์„œ ๊ฐ€์žฅ ์ ํ•ฉํ•œ ๋ถ„ํฌ๋Š” ๊ฒ€์ • ํ†ต๊ณ„๋Ÿ‰ AD์™€ p-value๋ฅผ ๋น„๊ตํ•˜์—ฌ ์„ ์ •ํ•˜์˜€๋‹ค.

3. ์‹œํ—˜ ์‹œํŽธ ๋ฐ ์ „๊ธฐ์  ํŠน์„ฑ ๋ถ„์„ ๋ฐฉ๋ฒ•

3.1. ์‹œํ—˜ ์‹œํŽธ

DGEBA์™€ ESO๋ฅผ 7:3 ๋น„์œจ๋กœ ํ˜ผํ•ฉํ•œ ์ˆ˜์ง€์™€ ๊ฒฝํ™”์ œ, ๊ทธ๋ฆฌ๊ณ  ๋งˆ์ดํฌ๋กœ ํฌ๊ธฐ SiOโ‚‚ 65 wt%๋กœ ๊ตฌ์„ฑ๋œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด๋ฅผ ์‹œํ—˜ ์‹œํŽธ์œผ๋กœ ์‚ฌ์šฉํ•˜์˜€๋‹ค. DGEBA์™€ ESO์˜ ๊ฐ ๋‹น๋Ÿ‰์€ 184~190 g/eq, 232 g/eq์ด๋ฉฐ, ์ƒ์˜จ์—์„œ์˜ ๊ฐ ์ ๋„๋Š” 11,500~13,500 cPs, 310 cPs์ด๋‹ค. ๊ฒฝํ™”์ œ๋Š” ์‚ฐ๋ฌด์ˆ˜๋ฌผ๊ณ„์ธ NH-2200์„, ๊ฒฝํ™” ์ด‰์ง„์ œ๋Š” Benzyldimethylamine(BDMA)์„ ์‚ฌ์šฉํ•˜์˜€๋‹ค. Fig. 1์€ ์‹œํ—˜ ์‹œํŽธ์˜ ํ˜•์ƒ์„ ๋‚˜ํƒ€๋‚ด๋ฉฐ, ํ•œ ๋ณ€์˜ ๊ธธ์ด๊ฐ€ 100mm์ธ ํ‰ํŒ ํ˜•์ƒ ์‹œํŽธ์œผ๋กœ ํ‰๊ท  ๋‘๊ป˜๋Š” ์•ฝ 2mm์ด๋‹ค.

Fig. 1. Bio-epoxy micro-composites

../../Resources/kiiee/JIEIE.2026.40.1.49/fig1.png

3.2. ์ „๊ธฐ์  ํŠน์„ฑ ์ธก์ •

IEC 62631-2์˜ ๊ทœ๊ฒฉ์— ๋”ฐ๋ผ AC ๊ณ ์ „์••(1kV, 60Hz)์„ ์ธ๊ฐ€ํ•˜์—ฌ ์œ ์ „์œจ๊ณผ ์œ ์ „์†์‹ค์„ ์ธก์ •ํ•˜์˜€๋‹ค. ์‹œํ—˜ ์žฅ๋น„๋กœ Fig. 2์— ๋‚˜ํƒ€๋‚ธ Fully Automatic Capacitance and Loss Factor tanฮด Precision Measuring Bridge(Tettex)๋ฅผ ์‚ฌ์šฉํ•˜์˜€๋‹ค. Type 2914 ์žฅ๋น„์— ์‹œํ—˜ ์‹œํŽธ์„ ๊ณ ์ •์‹œํ‚ค๊ณ , Type 2818A ์žฅ๋น„๋ฅผ ์ด์šฉํ•˜์—ฌ ์œ ์ „์œจ๊ณผ ์œ ์ „์†์‹ค ๊ฐ’์„ ๊ธฐ๋กํ•˜์˜€๋‹ค.

๋˜ํ•œ, ์ „๊ธฐ์ „๋„๋„ ์ธก์ •์„ ์œ„ํ•ด Fig. 3์˜ Tektronix ์‚ฌ์˜ 6485 Picoammeter Current Measurement์— DC ๊ณ ์ „์••์„ ์ธ๊ฐ€ํ•˜์—ฌ ์ฒด์ ๋ˆ„์„ค์ „๋ฅ˜(Volume Leakage Current)๋ฅผ ์ธก์ •ํ•˜์˜€๋‹ค. ์ธก์ •์€ ์ƒ์˜จ์—์„œ ์ง„ํ–‰ํ–ˆ๋‹ค.

Fig. 2. Relative permittivity and dielectric loss tangent measuring device

../../Resources/kiiee/JIEIE.2026.40.1.49/fig2.png

Fig. 3. Volume leakage current measuring device

../../Resources/kiiee/JIEIE.2026.40.1.49/fig3.png

3.3. ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜

Fig. 4๋Š” ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜์˜ ๊ตฌ์„ฑ๋„๋ฅผ ๋‚˜ํƒ€๋‚ธ๋‹ค. AC ์ ˆ์—ฐ๋‚ด๋ ฅ ์ธก์ •์„ ์œ„ํ•ด์„œ AC ๊ณ ์ „์•• ๋ฐœ์ƒ๊ธฐ, ์‹คํ—˜ ์ „๊ทน์œผ๋กœ ๊ตฌ์„ฑํ•˜์˜€๋‹ค. ์‹คํ—˜ ์ „๊ทน์˜ ํ˜•์ƒ์€ IEC 60243-1์˜ ๊ทœ๊ฒฉ์— ๋”ฐ๋ผ์„œ ์„ค๊ณ„๋˜์—ˆ์œผ๋ฉฐ, ์‹คํ—˜ ๋„์ค‘์— ๋ฐœ์ƒํ•  ์ˆ˜ ์žˆ๋Š” ์—ฐ๋ฉด ๋ฐฉ์ „์„ ์ตœ์†Œํ™”ํ•˜๊ธฐ ์œ„ํ•ด์„œ ์‹œํŽธ์ด ์œ„์น˜ํ•œ ์ „๊ทน์˜ ์ฃผ๋ณ€ ๋งค์งˆ๋กœ ๊ด‘์œ ๋ฅผ ์‚ฌ์šฉํ•˜์˜€๋‹ค. ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜์€ 10~20 sec ์‚ฌ์ด์— ๋ฐœ์ƒํ•˜๋„๋ก ์ „์••์„ 2kV/sec ์†๋„๋กœ ์ƒ์Šน์‹œ์ผœ, ์ ˆ์—ฐํŒŒ๊ดด๊ฐ€ ๋ฐœ์ƒํ•˜๋Š” ์ „์••์„ ๊ธฐ๋กํ•˜์˜€๋‹ค. ์ด ์‹œํ—˜์„ ๋‹จ์‹œ๊ฐ„ ํŒŒ๊ดด ์‹คํ—˜(RT: Ramp Test)์ด๋ผ๊ณ  ํ•œ๋‹ค.

RT์—์„œ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ Weibull ๋ถ„ํฌ๋กœ ๋ถ„์„ํ•˜์—ฌ ์–ป์€ ์ฒ™๋„ ๋ชจ์ˆ˜์˜ 40%์— ํ•ด๋‹นํ•˜๋Š” ๊ฐ’์„ ์ดˆ๊ธฐ ์ „์••์œผ๋กœ ์„ค์ •ํ•˜๊ณ , IEC 60243-1 ๊ทœ๊ฒฉ์˜ ํ‘œ๋ฅผ ์ฐธ๊ณ ํ•˜์—ฌ 60 sec ๊ฐ„๊ฒฉ์œผ๋กœ 0.5kV์”ฉ ์ฆ๊ฐ€ํ•˜์—ฌ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ ๊ธฐ๋กํ•˜์˜€์œผ๋ฉฐ, ์ด๋ฅผ ๊ณ„๋‹จ์‹ ํŒŒ๊ดด ์‹คํ—˜(ST: Step-up Test)์ด๋ผ๊ณ  ํ•œ๋‹ค. 60 sec ST์—์„œ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ Weibull ๋ถ„ํฌ ๋ถ„์„์„ ํ†ตํ•ด์„œ ์–ป์€ ์ฒ™๋„ ๋ชจ์ˆ˜์˜ 40%์— ํ•ด๋‹นํ•˜๋Š” ๊ฐ’์„ ์ดˆ๊ธฐ ์ „์••์œผ๋กœ ํ•˜์—ฌ 10min ๊ฐ„๊ฒฉ์œผ๋กœ 0.5kV์”ฉ ์ „์••์„ ์Šน์••ํ•˜์—ฌ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ ๊ธฐ๋กํ•˜์˜€๋‹ค. ๋™์ผํ•œ ๋ฐฉ์‹์œผ๋กœ ์ดˆ๊ธฐ ์ „์••์„ ์„ค์ • ํ›„ 30min ๊ฐ„๊ฒฉ์œผ๋กœ 0.5kV์”ฉ ์ฆ๊ฐ€ํ•˜์—ฌ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ ๊ธฐ๋กํ•˜์˜€๋‹ค. 30min ST์—์„œ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ Weibull ๋ถ„ํฌ ๋ถ„์„ ํ›„ ๋„์ถœ๋œ ์ฒ™๋„ ๋ชจ์ˆ˜๋ณด๋‹ค ์ž‘์€ ๊ฐ’์œผ๋กœ AST์˜ ์ „์••์„ ์„ ์ •ํ–ˆ๋‹ค.

Fig. 4. Diagram of experiment for AC breakdown test

../../Resources/kiiee/JIEIE.2026.40.1.49/fig4.png

3.4. ๊ฐ€์†์—ดํ™”์‹œํ—˜

AST๋ฅผ ํ†ตํ•ด ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ๋ฅผ ํš๋“ํ•˜์˜€๋‹ค. AST๋ฅผ ์œ„ํ•œ ์‹œํ—˜ ํšŒ๋กœ์˜ ๊ตฌ์„ฑ์€ Fig. 5์— ๋„์‹œํ•˜์˜€๋‹ค.

๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜ ๊ฒฐ๊ณผ๋กœ๋ถ€ํ„ฐ ์ •ํ•œ AST์˜ ์ดˆ๊ธฐ ์ „์••์„ ์ผ์ •ํ•˜๊ฒŒ ์ธ๊ฐ€ํ•˜์˜€๊ณ , ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ ˆ์—ฐํŒŒ๊ดด๋˜๋Š” ์‹œ์ ์„ ๋ฆด๋ ˆ์ด๋กœ ํ™•์ธํ•˜์˜€๋‹ค. ๋˜ํ•œ, ์ ˆ์—ฐํŒŒ๊ดด ์‹œ๊ฐ„(์ˆ˜๋ช… ๋ฐ์ดํ„ฐ)์€ ํƒ€์ด๋จธ๋ฅผ ํ†ตํ•ด ๊ธฐ๋กํ•˜์˜€๋‹ค.

Fig. 5. Accelerated stress test set-up

../../Resources/kiiee/JIEIE.2026.40.1.49/fig5.png

4. ์‹คํ—˜ ๊ฒฐ๊ณผ

4.1. ์ „๊ธฐ์  ํŠน์„ฑ ๋ถ„์„

Table 1์€ ์‹คํ—˜์—์„œ ์‚ฌ์šฉ๋œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด ์‹œํŽธ์˜ ์ „๊ธฐ์  ํŠน์„ฑ ๊ฒฐ๊ณผ๋กœ 15ํšŒ์”ฉ ์ธก์ •ํ•˜์˜€๋‹ค. ์œ ์ „์œจ์˜ ๊ฒฝ์šฐ ํ‰๊ท  3.92์˜ ๊ฐ’์„ ๋‚˜ํƒ€๋‚ด์—ˆ๊ณ , ์ด ๊ฐ’์€ ๋ฌธํ—Œ [4]์—์„œ ์ธก์ •๋œ ESO๊ฐ€ 30 phr ๋“ค์–ด๊ฐ„ ์‹œํŽธ์˜ ์œ ์ „์œจ๊ณผ ์œ ์‚ฌํ•˜๋‹ค.

์‹œํ—˜์— ์‚ฌ์šฉ๋œ ์‹œํŽธ์€ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ์ˆ˜์ง€์— SiOโ‚‚๊ฐ€ ์ฒจ๊ฐ€๋œ ๋ณตํ•ฉ์ฒด๋กœ, ์œ ์ „์œจ์€ ์‹ (1)๋กœ ๊ณ„์‚ฐํ•  ์ˆ˜ ์žˆ๋‹ค[12].

(1)
$\epsilon_C = v_R \epsilon_R + v_F \epsilon_F$

์—ฌ๊ธฐ์„œ $\epsilon_C$๋Š” ๋ณตํ•ฉ์ฒด์˜ ์œ ์ „์œจ์ด๋ฉฐ, $v_R$์™€ $v_F$๋Š” ๊ฐ๊ฐ ๋ณตํ•ฉ์ฒด์—์„œ ์ฐจ์ง€ํ•˜๋Š” ์ˆ˜์ง€์™€ ํ•„๋Ÿฌ์˜ ๋ถ€ํ”ผ ๋น„์ด๋‹ค($v_R + v_F = 1$). $\epsilon_R$๊ณผ $\epsilon_F$๋Š” ๊ฐ๊ฐ ์ˆ˜์ง€์™€ ํ•„๋Ÿฌ์˜ ์œ ์ „์œจ์„ ์˜๋ฏธํ•œ๋‹ค. ์ˆœ์ˆ˜ํ•œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ์ˆ˜์ง€์˜ ์œ ์ „์œจ์€ ์•ฝ 3.0, SiOโ‚‚์˜ ์œ ์ „์œจ์€ 4.5์ด๋‹ค. ์‹œํŽธ์— ์ฒจ๊ฐ€๋œ ์ˆ˜์ง€์™€ ํ•„๋Ÿฌ์˜ ๋ฐ€๋„๋ฅผ ๋ฐ˜์˜ํ•˜์—ฌ ์งˆ๋Ÿ‰๋น„๋ฅผ ๋ถ€ํ”ผ ๋น„๋กœ ํ™˜์‚ฐํ•˜์—ฌ ๊ณ„์‚ฐํ•˜๋ฉด ์•ฝ 3.98๋กœ ์ธก์ •๋œ ๊ฒฐ๊ณผ์™€ ๊ทผ์‚ฌํ•œ ๊ฐ’์„ ๋ณด์ธ๋‹ค.

์ด๋Ÿฌํ•œ ์œ ์ „์œจ์€ ๋ถ„๊ทน ํ˜„์ƒ๊ณผ๋„ ๊ด€๋ จ๋˜์–ด ์žˆ๋‹ค. ์‹ (2)๋Š” ๋ถ„๊ทน๊ณผ ์œ ์ „์œจ์˜ ๊ด€๊ณ„๋ฅผ ๋‚˜ํƒ€๋‚ธ๋‹ค.

(2)
$P = \epsilon_0 \chi_e E = \epsilon_0 (\epsilon_r - 1)E$

์ด๋•Œ, $\epsilon_0$๋Š” ์ง„๊ณต์˜ ์œ ์ „์œจ(8.854 ร— 10โปยนยฒ F/m), $\epsilon_r$์€ ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์œ ์ „์œจ, $\chi_e$๋Š” ์ „๊ธฐ ๊ฐ์ˆ˜์œจ, E๋Š” ์ธ๊ฐ€ ์ „๊ณ„, ๊ทธ๋ฆฌ๊ณ  P๋Š” ๋ถ„๊ทน์ด๋‹ค.

์œ ์ „์œจ์ด ๋†’์€ ๊ฒฝ์šฐ์— ๋ถ„๊ทน ํ˜„์ƒ์ด ์ƒ๋Œ€์ ์œผ๋กœ ์‰ฝ๊ฒŒ ๋ฐœ์ƒํ•˜๋ฉฐ, ์ด์— ๋”ฐ๋ผ ๊ณ ์ „์••์ด ์ธ๊ฐ€๋˜๋ฉด ์ ˆ์—ฐ์žฌ๋ฃŒ ๋‚ด๋ถ€์—์„œ ์ „๊ณ„์˜ ์ง„์ „์ด ๋นจ๋ผ์ง„๋‹ค. ์ฆ‰, ์œ ์ „์œจ์ด ๋†’์„์ˆ˜๋ก ์ ˆ์—ฐํŒŒ๊ดด๊ฐ€ ๋” ์‰ฝ๊ฒŒ ๋ฐœ์ƒํ•  ์ˆ˜ ์žˆ์œผ๋ฉฐ, ์ด๋ฅผ ๊ณ ๋ คํ•˜์—ฌ ์ ˆ์—ฐ๋‚ด๋ ฅ์„ ํ‰๊ฐ€ํ•ด์•ผ ํ•œ๋‹ค.

์œ ์ „์†์‹ค์€ ํ‰๊ท  0.0318๋กœ ์ธก์ •๋˜์—ˆ๋‹ค. ์œ ์ „์†์‹ค์€ ์ ˆ์—ฐ ์ง„๋‹จ ํ‰๊ฐ€ ์š”์†Œ ์ค‘ ํ•˜๋‚˜๋กœ ์ „๊ธฐ์  ์ ˆ์—ฐ ์ˆ˜๋ช… ๋„์ถœ ์‹œ ํ™œ์šฉํ•˜๊ธฐ๋„ ํ•œ๋‹ค. ์œ ์ „์†์‹ค์€ ๋ณต์†Œ์œ ์ „์œจ($\epsilon_r^*$)์—์„œ ์‹ค์ˆ˜๋ถ€($\epsilon_r'$)์™€ ํ—ˆ์ˆ˜๋ถ€($\epsilon_r''$)์˜ ๋น„์œจ๋กœ ํ‘œํ˜„๋œ๋‹ค.

(3)
$\epsilon_r^* = \frac{G}{j\omega C_0} + \frac{C}{C_0} = \frac{C}{C_0} - j\frac{G}{\omega C_0} = \epsilon_r' - j\epsilon_r''$
(4)
$\tan\delta = \frac{\epsilon_r''}{\epsilon_r'} = \left| \frac{I_R}{I_C} \right| = \frac{1}{\omega RC} = \frac{\sigma}{\omega\epsilon}$

์‹ (4)๋ฅผ ํ†ตํ•ด์„œ ์œ ์ „์†์‹ค์ด ํฌ๋ฉด ์ „๋„ ์ „๋ฅ˜๊ฐ€ ๋งŽ์ด ํ๋ฅด๋Š” ๊ฒƒ์œผ๋กœ ๋ณผ ์ˆ˜ ์žˆ๋‹ค. ์ด๋Š” ์ „๊ธฐ์ „๋„๋„์˜ ํฌ๊ธฐ๊ฐ€ ํฌ๋‹ค๋Š” ๊ฒƒ์„ ์˜๋ฏธํ•œ๋‹ค.

์ผ๋ฐ˜์ ์œผ๋กœ ๊ณ ๋ถ„์ž ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์œ ์ „์†์‹ค์€ 0.01๋ณด๋‹ค ์ž‘๋‹ค. ๊ทธ๋Ÿฌ๋‚˜ ์œ ์ „์†์‹ค์€ 0.0318๋กœ ํฌ๊ฒŒ ์ธก์ •๋˜์—ˆ๋‹ค. ์ด๋Š” ์ „๊ธฐ์ „๋„๋„ ์ธก์ • ๊ฒฐ๊ณผ 2.5 ร— 10โปยนยฒ S/cm๋กœ ์—ํญ์‹œ์˜ ํ‰๊ท ์ ์ธ ์ „๊ธฐ์ „๋„๋„๋ณด๋‹ค ๊ฐ’์ด ํฐ ๊ฒƒ์ด ๊ธฐ์ธํ•œ ๊ฒฐ๊ณผ๋กœ ํŒ๋‹จ๋œ๋‹ค.

Table 1. Electrical properties of the bio-epoxy composites

Classification Average Value
์œ ์ „์œจ 3.92
์œ ์ „์†์‹ค 0.0318
์ „๊ธฐ์ „๋„๋„ [S/cm] 2.5 ร— 10-12

4.2. AC ์ ˆ์—ฐ๋‚ด๋ ฅ

AC ์ ˆ์—ฐ๋‚ด๋ ฅ์€ ๊ฐ ์‹œํ—˜์—์„œ ํš๋“ํ•œ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• $V_{BD}$์™€ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ๋‘๊ป˜ $t_{BEC}$๋ฅผ ์ด์šฉํ•˜์—ฌ ๊ณ„์‚ฐํ•˜์˜€๋‹ค.

(5)
$E_{BD} = \frac{V_{BD}}{t_{BEC}}$

AC ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜์œผ๋กœ๋ถ€ํ„ฐ ํš๋“ํ•œ ์ ˆ์—ฐ๋‚ด๋ ฅ์€ Fig. 6์— ๋‚˜ํƒ€๋‚ด์—ˆ๋‹ค. AC ์ ˆ์—ฐ๋‚ด๋ ฅ์€ RT๊ฐ€ 22.96kV/mm๋กœ ๊ฐ€์žฅ ๋†’์•˜๊ณ , 30min ST์—์„œ ์•ฝ 13.51kV/mm๋กœ ๊ฐ€์žฅ ๋‚ฎ์•˜๋‹ค. ํ•ด๋‹น ๊ฒฐ๊ณผ๋Š” ์ „์••์„ ์ธ๊ฐ€ํ•˜๋Š” ์‹œ๊ฐ„์ด ๊ธธ์–ด์งˆ์ˆ˜๋ก ์ ˆ์—ฐ๋‚ด๋ ฅ์ด ๊ฐ์†Œํ•จ์„ ๋ณด์—ฌ์ค€๋‹ค. ์ด ๊ฒฐ๊ณผ์—์„œ RT์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ์€ ๊ฐ ST์—์„œ์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ๊ณผ ๋‹ฌ๋ฆฌ ๋น„๊ต์  ํฐ ํŽธ์ฐจ๋ฅผ ๋ณด์˜€๋‹ค. 3.1์ ˆ์—์„œ ์‹œํ—˜ ์‹œํŽธ์˜ ํ‰๊ท  ๋‘๊ป˜๋ฅผ 2mm๋กœ ์ œ์‹œํ•˜์˜€์œผ๋‚˜, ์‹ค์ œ ์ธก์ •๋œ ์‹œํ—˜ ์‹œํŽธ์˜ ๋‘๊ป˜๋Š” 1.98~2.06 ๋ฒ”์œ„์˜ ๋ณ€๋™์„ ๋ณด์˜€๋‹ค. ์ด์— ๋”ฐ๋ผ ์‹œํŽธ์˜ ๋‘๊ป˜ ์˜ํ–ฅ์„ ๋ฌด์‹œํ•˜๊ธฐ ์–ด๋ ต๋‹ค. ๋˜ํ•œ, RT์˜ ๊ฒฝ์šฐ ์ „์••์˜ ์ธ๊ฐ€ ์†๋„๊ฐ€ ๋” ๋น ๋ฅด๋ฏ€๋กœ, ์ ˆ์—ฐํŒŒ๊ดด ๊ฐœ์‹œ ๊ณผ์ •์—์„œ ํ•„์š”ํ•œ ์ „ํ•˜ ์ฃผ์ž… ๋ฐ ์ „์ž์‚ฌํƒœ ํ˜•์„ฑ ๊ณผ์ •์ด ์ฆ‰์‹œ ์™„๋ฃŒ๋˜์ง€ ๋ชปํ•ด ์ ˆ์—ฐํŒŒ๊ดด ์‹œ์ ์ด ์ง€์—ฐ๋˜๋Š” Time-lag ํ˜„์ƒ์— ๊ธฐ์ธํ•œ ๊ฒƒ์œผ๋กœ ํŒ๋‹จ๋œ๋‹ค[13].

๋˜ํ•œ, Table 2 ๋ฐ 3์€ ๊ฐ ์‹คํ—˜ ๋ฐฉ๋ฒ•์— ๋Œ€ํ•œ AC ์ ˆ์—ฐ๋‚ด๋ ฅ ๊ฐ’์— ๋Œ€ํ•ด ์ˆ˜ํ–‰ํ•œ ์ •๊ทœ์„ฑ ๊ฒ€์ • ๊ฒฐ๊ณผ๋ฅผ ์š”์•ฝํ•œ๋‹ค. Table 2๋Š” Shapiro-Wilk ๋ฐฉ๋ฒ•์„ ์ด์šฉํ•œ ์ •๊ทœ์„ฑ ๊ฒ€์ • ๊ฒฐ๊ณผ๋ฅผ, Table 3์€ Kolmogorov-Smirnov ๋ฐฉ๋ฒ•์„ ์ด์šฉํ•˜์—ฌ ์ •๊ทœ์„ฑ ๊ฒ€์ •ํ•œ ๊ฒฐ๊ณผ๋ฅผ ๋ณด์—ฌ์ค€๋‹ค. ๊ฒ€์ • ํ†ต๊ณ„๋Ÿ‰(Shapiro-Wilk: W, Kolmogorov-Smirnov: KS)๊ณผ ๊ฐ ๋ฐฉ๋ฒ•์— ๋Œ€ํ•œ p-value, ์ •๊ทœ ๋ถ„ํฌ๋ฅผ ๋งŒ์กฑํ•˜๋Š”์ง€์— ๋Œ€ํ•œ ์—ฌ๋ถ€๋ฅผ ๊ฐ Table์— ํ‘œ๊ธฐํ•˜์˜€๋‹ค. ๋‘ ๋ฐฉ๋ฒ•์„ ์ด์šฉํ•œ AC ์ ˆ์—ฐ๋‚ด๋ ฅ์˜ ์ •๊ทœ์„ฑ ๊ฒ€์ • ๊ฒฐ๊ณผ, ๋ชจ๋“  ์‹คํ—˜ ๊ฒฐ๊ณผ์—์„œ p-value > 0.05๋ฅผ ๋งŒ์กฑํ•˜์˜€๋‹ค. ์ด ๊ฒฐ๊ณผ๋Š” ๋ชจ๋“  ์‹คํ—˜๊ฐ’์ด ์ •๊ทœ ๋ถ„ํฌ๋ฅผ ๋”ฐ๋ฅธ๋‹ค๋Š” ๊ฒƒ์„ ์˜๋ฏธํ•œ๋‹ค.

Table 2. Shapiro-Wilk test of compliance with normal distribution

Test Type W p-value Conformity
RT 0.977 0.706 Accepted
60 sec ST 0.983 0.753 Accepted
10 min ST 0.944 0.544 Accepted
30 min ST 0.992 0.831 Accepted

Table 3. Kolmogorov-Smirnov test of compliance with normal distribution

Test Type KS p-value Conformity
RT 0.237 >0.150 Accepted
60 sec ST 0.226 >0.150 Accepted
10 min ST 0.274 >0.150 Accepted
30 min ST 0.207 >0.150 Accepted

Table 4. Hypothesis test of compliance with Weibull distribution

Test Type AD p-value Conformity
RT 0.260 >0.250 Accepted
60 sec ST 0.297 >0.250 Accepted
10 min ST 0.354 >0.250 Accepted
30 min ST 0.282 >0.250 Accepted

Table 4๋Š” ๋‹ค์–‘ํ•œ ์‹คํ—˜ ๋ฐฉ๋ฒ•์—์„œ์˜ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ AC ์ ˆ์—ฐ๋‚ด๋ ฅ์— ๋Œ€ํ•œ Weibull ๋ถ„ํฌ ๋ถ„์„ ๊ฒฐ๊ณผ๋ฅผ ์š”์•ฝํ•œ๋‹ค. Anderson-Darling ๋ฐฉ๋ฒ•์„ ํ™œ์šฉํ•˜์—ฌ Weibull ๋ถ„ํฌ๋กœ ๋ถ„์„ํ•œ AC ์ ˆ์—ฐ๋‚ด๋ ฅ์˜ AD ํ†ต๊ณ„๋Ÿ‰๊ณผ p-value๋ฅผ ๋„์ถœํ•˜์˜€๋‹ค. ๊ฐ ์‹คํ—˜ ๋ฐฉ๋ฒ•์—์„œ ํš๋“ํ•œ AC ์ ˆ์—ฐ๋‚ด๋ ฅ์€ p-value > 0.250์ด๋ฏ€๋กœ, ์œ ์˜์ˆ˜์ค€ 0.05์— ๋น„ํ•ด ํฌ๋‹ค. ๋”ฐ๋ผ์„œ ๋ชจ๋“  ์‹คํ—˜์—์„œ์˜ AC ์ ˆ์—ฐ๋‚ด๋ ฅ์€ Weibull ๋ถ„ํฌ ๋ฒ•์น™๋„ ์ž˜ ๋”ฐ๋ฅธ๋‹ค๋Š” ๊ฒƒ์„ ์˜๋ฏธํ•œ๋‹ค. ํ†ต๊ณ„ ๋ถ„์„์€ R๊ณผ Minitab ์†Œํ”„ํŠธ์›จ์–ด๋ฅผ ์ด์šฉํ•ด ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค.

ํ•œํŽธ, ๋ณธ ์—ฐ๊ตฌ๋Š” ํ™˜๊ฒฝ ์˜ค์—ผ ๋ฌธ์ œ๋ฅผ ์™„ํ™”ํ•˜๊ธฐ ์œ„ํ•ด์„œ ๋ฐ”์ด์˜ค ๊ธฐ๋ฐ˜ ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ ˆ์—ฐ์„ฑ๋Šฅ์„ ํ‰๊ฐ€ํ•˜์˜€๋‹ค. ํ•˜์ง€๋งŒ ํ˜„์žฌ ์ „๋ ฅ์„ค๋น„์—๋Š” ์ƒ์šฉ ์—ํญ์‹œ ์ ˆ์—ฐ์žฌ๊ฐ€ ์ฃผ๋กœ ์‚ฌ์šฉ๋˜๊ณ  ์žˆ์œผ๋ฏ€๋กœ, ๋ฐ”์ด์˜ค ์—ํญ์‹œ๋กœ์˜ ๋Œ€์ฒด ๊ฐ€๋Šฅ์„ฑ์„ ๊ฒ€ํ† ํ•˜๊ธฐ ์œ„ํ•ด์„œ๋Š” ๊ธฐ์กด ์—ํญ์‹œ์™€์˜ ์ ˆ์—ฐ ํŠน์„ฑ ๋น„๊ต๊ฐ€ ํ•„์ˆ˜์ ์ด๋‹ค. ๋ฌธํ—Œ [14]์—์„œ๋Š” ์ƒ์šฉ ๊ณ ์ „์••์šฉ ์—ํญ์‹œ์— ๋งˆ์ดํฌ๋กœ ์‹ค๋ฆฌ์นด๋ฅผ 40~70 wt% ์ฒจ๊ฐ€ํ•œ ๋ณตํ•ฉ์ฒด์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ์„ ๋ถ„์„ํ•˜์˜€์œผ๋ฉฐ, ๋งˆ์ดํฌ๋กœ ์‹ค๋ฆฌ์นด ํ•จ์œ ๋Ÿ‰์ด 60~70 wt%์ธ ์กฐ๊ฑด์—์„œ RT๋กœ ์ธก์ •๋œ ์ ˆ์—ฐ๋‚ด๋ ฅ(์ฒ™๋„ ๋ชจ์ˆ˜)์€ 25.9~26.75kV/mm๋กœ ๋ณด๊ณ ๋˜์—ˆ๋‹ค.

๋ฐ˜๋ฉด, ๋ณธ ์—ฐ๊ตฌ์—์„œ RT๋กœ ์ธก์ •๋œ AC ์ ˆ์—ฐ๋‚ด๋ ฅ(์ฒ™๋„ ๋ชจ์ˆ˜)์˜ ๊ฒฝ์šฐ 23.74kV/mm๋กœ, ๊ธฐ์กด ์ƒ์šฉ ์—ํญ์‹œ ๋Œ€๋น„ ์•ฝ 8.3~11.3% ๋‚ฎ์€ ๊ฐ’์„ ๋ณด์˜€๋‹ค. ๋‹ค๋งŒ, ์ด๋Ÿฌํ•œ ์ฐจ์ด๋Š” ์ธก์ • ์กฐ๊ฑด, ์‹ค๋ฆฌ์นด ํŠน์„ฑ, ์‹œํ—˜ ์ „๊ทน, ์‹œํŽธ ์ œ์กฐ ์กฐ๊ฑด ๋“ฑ ๋‹ค์–‘ํ•œ ์™ธ๋ถ€ ์š”์ธ์— ์˜ํ•ด ์ถฉ๋ถ„ํžˆ ๋ฐœ์ƒ ๊ฐ€๋Šฅํ•œ ๋ฒ”์œ„์ด๋‹ค. ๋”ฐ๋ผ์„œ ESO ์ฒจ๊ฐ€์— ์˜ํ•œ ์ ˆ์—ฐ์„ฑ๋Šฅ ์ €ํ•˜๋กœ ๋‹จ์ •ํ•˜๊ธฐ๋Š” ์–ด๋ ต๋‹ค. ์‹ค์ œ๋กœ, ๋ฌธํ—Œ [14]๋Š” 1kV/sec์˜ ์ „์•• ์ƒ์Šน๋ฅ ์„ ์ ์šฉํ•œ ์‹คํ—˜์ด๋ฏ€๋กœ ์ธก์ • ์กฐ๊ฑด ์ฐจ์ด๊ฐ€ ์กด์žฌํ•˜๋ฉฐ, ๋ณธ ๋น„๊ต๋Š” ์ƒ๋Œ€์ ์œผ๋กœ ๋‹จ๊ธฐ๊ฐ„ ์ˆ˜ํ–‰๋œ RT ๊ฒฐ๊ณผ์— ํ•œ์ •๋˜์–ด ์žˆ๋‹ค. ๋”ฐ๋ผ์„œ ST ๋ฐ AST ๋“ฑ ์žฅ๊ธฐ ์ ˆ์—ฐ ์‹ ๋ขฐ์„ฑ ๊ฒ€์ฆ์„ ์œ„ํ•œ ํ›„์† ์—ฐ๊ตฌ๊ฐ€ ํ•„์š”ํ•˜๋‹ค.

Fig. 6. AC breakdown strength of the short-time test

../../Resources/kiiee/JIEIE.2026.40.1.49/fig6.png

4.3. ๊ฐ€์†์—ดํ™”์‹œํ—˜ ๋ฐ์ดํ„ฐ ๋ถ„์„

4.2์ ˆ๊ณผ ์œ ์‚ฌํ•˜๊ฒŒ AST ๊ฒฐ๊ณผ ํš๋“ํ•œ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ์— ๋Œ€ํ•œ ํ†ต๊ณ„ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. 30min ST์—์„œ์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ์ด 13.51kV/mm์ธ ์ ์„ ๊ณ ๋ คํ•˜์—ฌ, ๊ทธ๋ณด๋‹ค ๋” ๋‚ฎ์€ ์ „๊ณ„์ธ 12.5kV/mm๊ฐ€ ์ธ๊ฐ€๋˜๋„๋ก AC ๊ณ ์ „์•• ๋ฐœ์ƒ๊ธฐ์˜ ์ „์••์„ ์„ค์ •ํ•˜์˜€๋‹ค.

AST ์‹œ ์ ˆ์—ฐ์„ฑ๋Šฅ ๋ถ„์„์„ ์œ„ํ•ด์„œ ํ†ต๊ณ„์  ๋ถ„ํฌ(๋Œ€์ˆ˜ ์ •๊ทœ, Weibull, ์ง€์ˆ˜, ๊ฐ๋งˆ ๋ถ„ํฌ)๋ฅผ ์ ์šฉํ•˜์˜€๋‹ค. Table 5๋Š” 12.5kV/mm ์ „๊ณ„๊ฐ€ ์ธ๊ฐ€๋œ ๊ณ ์žฅ ๋ฐ์ดํ„ฐ(Complete Data)๋ฅผ ๋ถ„์„ํ•˜์—ฌ ๊ฐ ๋ถ„ํฌ ๋ณ„ ํš๋“ํ•œ B1, B5, B10, B50์„ ์š”์•ฝํ•œ ๊ฒƒ์ด๋‹ค. ๊ฐ ๋ถ„ํฌ ๋ณ„ ๋ฐ์ดํ„ฐ์˜ CI๋Š” 95%๋กœ ํ•˜์˜€๋‹ค.

Table 6์€ ๋ฐ์ดํ„ฐ ๋ถ„์„์— ๊ฐ€์žฅ ์ ํ•ฉํ•œ ๋ถ„ํฌ ์„ ์ •์„ ์œ„ํ•ด ์ˆ˜ํ–‰ํ•œ Anderson-Darling ๊ฒ€์ •์˜ ๊ฒฐ๊ณผ๋ฅผ ์š”์•ฝํ•œ ๊ฒƒ์ด๋‹ค. AD ํ†ต๊ณ„๋Ÿ‰๊ณผ p-value๋ฅผ ์ด์šฉํ•˜์—ฌ ๋ถ„ํฌ ์ ํ•ฉ์„ฑ์„ ํ™•์ธํ•˜์˜€๋‹ค. AD ํ†ต๊ณ„๋Ÿ‰์€ ๊ด€์ธก๋œ ๋ฐ์ดํ„ฐ๊ฐ€ ์–ด๋– ํ•œ ๋ถ„ํฌ์— ์ ํ•ฉํ•œ์ง€ ํŒ๋‹จํ•  ์ˆ˜ ์žˆ๋Š” ์ง€ํ‘œ์ด๋‹ค. AD ํ†ต๊ณ„๋Ÿ‰์€ ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ๊ฐ€ 0.399๋กœ ๊ฐ€์žฅ ์ž‘๊ณ , ์ง€์ˆ˜ ๋ถ„ํฌ๊ฐ€ 2.272๋กœ ๊ฐ€์žฅ ํฌ๋‹ค. ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ์™€ ๋น„๊ตํ•˜์—ฌ Weibull ๋ถ„ํฌ๋Š” 0.113, ๊ฐ๋งˆ ๋ถ„ํฌ์˜ ๊ฒฝ์šฐ 0.056์˜ ์ฐจ์ด๋ฅผ ๋ณด์˜€๋‹ค. ์ง€์ˆ˜ ๋ถ„ํฌ๋Š” ๋‹ค๋ฅธ ๋ถ„ํฌ๋“ค๊ณผ ๋น„๊ตํ•˜์—ฌ AD๊ฐ€ ์ƒ๋Œ€์ ์œผ๋กœ ํฐ ๊ฒฝํ–ฅ์„ ๋ณด์˜€๋‹ค. ์ง€์ˆ˜ ๋ถ„ํฌ์˜ ๊ฒฝ์šฐ, ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ๊ฐ€ ์‹œ๊ฐ„๊ณผ ๋ฌด๊ด€ํ•œ ๋ฌด๊ธฐ์–ต์„ฑ(Memoryless Property)์œผ๋กœ ์ธํ•ด ๊ณ ์žฅ๋ฅ ๊ณผ ์‹œ๊ฐ„์˜ ๊ด€๊ณ„์ธ ์ˆ˜๋ช… ์š•์กฐ๊ณก์„ (Bath-tub Curve)์—์„œ ์šฐ๋ฐœ๊ณ ์žฅ(CFR: Constant Failure Rate) ์˜์—ญ์— ์†ํ•˜๊ธฐ ๋•Œ๋ฌธ์ด๋‹ค.

๋ถ„ํฌ ๋ฒ•์น™ ๊ฒ€์ • ๊ฒฐ๊ณผ, ๋‹ค๋ฅธ ๋น„๊ต ๋ถ„ํฌ๋“ค๊ณผ ๋‹ฌ๋ฆฌ ์ง€์ˆ˜ ๋ถ„ํฌ๋งŒ ์œ ์ผํ•˜๊ฒŒ p-value๊ฐ€ ์œ ์˜์ˆ˜์ค€ 0.05๋ณด๋‹ค ์ž‘์•„ ๊ท€๋ฌด๊ฐ€์„ค์ด ๊ธฐ๊ฐ๋˜์—ˆ๋‹ค. ๋”ฐ๋ผ์„œ, ์ง€์ˆ˜ ๋ถ„ํฌ๋ฅผ ํ™œ์šฉํ•˜์—ฌ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ˆ˜๋ช… ๋ฐ์ดํ„ฐ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜๊ธฐ์—๋Š” ์–ด๋ ค์›€์ด ์žˆ๋‹ค. ๋ฐ˜๋ฉด, ๋‹ค๋ฅธ ์„ธ ๋ถ„ํฌ์˜ ๊ฒฝ์šฐ p-value > 0.05๋ฅผ ๋งŒ์กฑํ•˜์—ฌ ๊ท€๋ฌด๊ฐ€์„ค์ด ์ฑ„ํƒ๋˜์—ˆ์œผ๋ฉฐ, ์š•์กฐ๊ณก์„ ์—์„œ ๋งˆ๋ชจ๊ณ ์žฅ(IFR: Increasing Failure Rate) ์˜์—ญ์— ์žˆ์œผ๋ฏ€๋กœ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์˜ ์ „๊ธฐ์  ์ ˆ์—ฐ์ˆ˜๋ช… ๋ถ„์„์— ํ™œ์šฉํ•  ์ˆ˜ ์žˆ๋‹ค.

๋ถ„ํฌ ์ ํ•ฉ์„ฑ ๊ฒ€์ • ๊ฒฐ๊ณผ, ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ์˜ AD ํ†ต๊ณ„๋Ÿ‰์ด ๊ฐ€์žฅ ์ž‘์€ ๊ฐ’์œผ๋กœ ์‚ฐ์ถœ๋˜์—ˆ๋‹ค. ๋”ฐ๋ผ์„œ, ๋ณธ ์—ฐ๊ตฌ์—์„œ ์‚ฌ์šฉ๋œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด์— ๋Œ€ํ•œ ์žฅ๊ธฐ ์ ˆ์—ฐ ์ˆ˜๋ช… ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•  ๊ฒฝ์šฐ, ๋Œ€์ˆ˜ ์ •๊ทœ ๋ถ„ํฌ๋ฅผ ์ด์šฉํ•˜๋Š” ๊ฒƒ์ด ์ ํ•ฉํ•œ ๊ฒƒ์œผ๋กœ ํŒ๋‹จ๋œ๋‹ค.

Table 5. Percentile for each distribution

Bx ๋Œ€์ˆ˜ ์ •๊ทœ Weibull ์ง€์ˆ˜ ๊ฐ๋งˆ
B1 673.01 666.69 6.8572 673.97
B5 675.72 672.84 34.997 676.40
B10 677.16 675.58 71.886 677.69
B50 682.28 682.80 472.93 682.28

Table 6. Hypothesis test of compliance with statistical distribution using AD

Distribution AD p-value Conformity
๋Œ€์ˆ˜ ์ •๊ทœ 0.399 0.214 Accepted
Weibull 0.512 0.173 Accepted
์ง€์ˆ˜ 2.272 <0.003 Rejected
๊ฐ๋งˆ 0.455 >0.250 Accepted

5. ๊ฒฐ ๋ก 

๋ณธ ๋…ผ๋ฌธ์—์„œ ๋ฐ”์ด์˜ค ์—ํญ์‹œ ๋ณตํ•ฉ์ฒด๋ฅผ ์ „๋ ฅ์„ค๋น„ ์ ˆ์—ฐ์— ์‚ฌ์šฉํ•˜๊ธฐ ์œ„ํ•ด์„œ ์ „๊ธฐ์  ํŠน์„ฑ ๋ฐ ์ ˆ์—ฐ์„ฑ๋Šฅ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ์œ ์ „์œจ๊ณผ ์œ ์ „์†์‹ค, ๊ทธ๋ฆฌ๊ณ  ์ „๊ธฐ์ „๋„๋„๋Š” ๊ธฐ์กด ๋ฌธํ—Œ์—์„œ ๋ณด๊ณ ๋œ ๊ฐ’๊ณผ ์œ ์‚ฌํ•˜๊ฒŒ ์ธก์ •๋˜์—ˆ๋‹ค.

์ ˆ์—ฐ์„ฑ๋Šฅ ๋ถ„์„์„ ์œ„ํ•ด์„œ AC ๋‹จ์‹œ๊ฐ„ ์ ˆ์—ฐํŒŒ๊ดด์‹คํ—˜ ๋ฐ ๊ฐ€์†์—ดํ™”์‹œํ—˜์„ ์ˆ˜ํ–‰ํ•˜๊ณ , ํ†ต๊ณ„์  ๊ธฐ๋ฒ•์„ ํ™œ์šฉํ•ด ์‹คํ—˜ ๊ฒฐ๊ณผ๋ฅผ ๋ถ„์„ํ•จ์œผ๋กœ์จ ํ†ต๊ณ„์  ์œ ์˜์„ฑ์„ ํ™•์ธํ–ˆ๋‹ค. ๊ฐ€์†์—ดํ™”์‹œํ—˜ ๊ฒฐ๊ณผ ํš๋“ํ•œ ์ ˆ์—ฐํŒŒ๊ดด ์‹œ๊ฐ„ ๋ฐ์ดํ„ฐ์˜ ๊ฒฝ์šฐ, Anderson-Darling ๊ฒ€์ •์„ ํ†ตํ•ด์„œ ์‹œํ—˜ ์‹œํŽธ์˜ ์ „๊ธฐ์  ์ ˆ์—ฐ ์ˆ˜๋ช… ์‚ฐ์ถœ ์‹œ ์ ์šฉํ•  ๊ฐ€์žฅ ์ ํ•ฉํ•œ ํ†ต๊ณ„์  ๋ถ„ํฌ๋ฅผ ์„ ์ •ํ•˜์˜€๋‹ค.

๋ณธ ์—ฐ๊ตฌ๋ฅผ ํ†ตํ•˜์—ฌ ํš๋“๋œ ์‹œํ—˜๋ฐ์ดํ„ฐ์— ๋Œ€ํ•œ ๋ถ„์„์„ ํ†ตํ•ด ํ–ฅํ›„์—๋Š” ๋ณด๋‹ค ๋‹ค์–‘ํ•œ ์กฐ๊ฑด์—์„œ์˜ ์žฅ๊ธฐ์ˆ˜๋ช…์‹œํ—˜์„ ์‹ค์‹œํ•  ๊ณ„ํš์ด๋‹ค. ๋˜ํ•œ, ์ „๋ ฅ์„ค๋น„๊ฐ€ ์šด์ „๊ณผ์ • ์ค‘์— ๊ฒฝํ—˜ํ•˜๊ฒŒ ๋˜๋Š” ์ „๊ธฐ์  ๋ฐ ์—ด์  ์กฐ๊ฑด์—์„œ์˜ ์—ดํ™” ํŠน์„ฑ์˜ ๋ถ„์„ ๋ฐ ์ˆ˜๋ช…์—ฐ๊ตฌ์— ๋Œ€ํ•œ ํ›„์† ์—ฐ๊ตฌ์ˆ˜ํ–‰์„ ํ†ตํ•ด ๋‹ค์–‘ํ•œ ์นœํ™˜๊ฒฝ ์ „๋ ฅ์„ค๋น„์˜ ์—ดํ™” ๋ถ„์„์— ํ™œ์šฉํ•  ์˜ˆ์ •์ด๋‹ค.

Acknowledgements

์ด ๋…ผ๋ฌธ์€ ์ •๋ถ€(๊ต์œก๋ถ€)์˜ ์žฌ์›์œผ๋กœ ํ•œ๊ตญ์—ฐ๊ตฌ์žฌ๋‹จ์˜ ์ง€์›์„ ๋ฐ›์•„ ์ˆ˜ํ–‰๋œ ๊ธฐ์ดˆ์—ฐ๊ตฌ์‚ฌ์—…์ž„(No. RS-2020-NR049604). ๋˜ํ•œ, ๋ณธ ๊ฒฐ๊ณผ๋ฌผ์€ 2025๋…„๋„ ๊ต์œก๋ถ€ ๋ฐ ์ถฉ์ฒญ๋ถ๋„์˜ ์žฌ์›์œผ๋กœ ์ถฉ๋ถRISE์„ผํ„ฐ์˜ ์ง€์›์„ ๋ฐ›์•„ ์ˆ˜ํ–‰๋œ ์ง€์—ญํ˜์‹ ์ค‘์‹ฌ ๋Œ€ํ•™์ง€์›์ฒด๊ณ„ (RISE)์˜ ๊ฒฐ๊ณผ์ž„(2025-RISE-11-014-03).

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Biography

Changyeong Cheon
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He received the B.S. and M.S. degrees in electrical engineering from Chungbuk National University, Cheongju, Republic of Korea, in 2022 and 2024, respectively, where he is currently pursuing the Ph.D. degree in electrical engineering. His research interests include high voltage systems, asset management, and statistical analysis.

Hyeondo Kim
../../Resources/kiiee/JIEIE.2026.40.1.49/au2.png

He received the B.S. degree in electrical engineering from Chungbuk National University, Cheongju, Republic of Korea, in 2025, where he is currently pursuing the M.S. degree in electrical engineering. His research interests include high voltage systems and statistical analysis.

Myungchin Kim
../../Resources/kiiee/JIEIE.2026.40.1.49/au3.png

He received the B.S. and M.S. degrees in electrical engineering from Hanyang University, Seoul, Republic of Korea, in 2004 and 2006, respectively, and the Ph.D. degree in electrical engineering from The University of Texas at Austin, TX, USA, in 2015. From 2006 to 2017, he was with the Agency for Defense Development, Daejeon, Republic of Korea. Since 2017, he has been with the School of Electrical Engineering, Chungbuk National University, Cheongju, Republic of Korea, where he is currently an Associate Professor. His research interests include high voltage systems, asset management, and microgrids.