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REFERENCES

1 
Vashchenko V. A., Shibkov A., 2010, ESD Design for Analog Circuits, Springer-VerlagGoogle Search
2 
Do K.I., Lee B.S., Koo Y.S., 2018, Study on 4H-SiC GGNMOS Based ESD Protection Circuit With Low Trigger Voltage Using Gate-Body Floating Technique for 70-V Applications, IEEE Electron Device Letters, pp. 283-286DOI
3 
Song B.B., Do K.I., Koo Y.S., 2018, SCR-Based ESD Protection Using a Penta-Well for 5V Applications, Journal of the Electron Devices Society, pp. 691-695DOI
4 
Semenov O., Sarbishaei H., Sachdev M., 2008, ESD Protection Device and Circuit Design for Advanced CMOS Technologies, Springer, NetherlandsGoogle Search
5 
Vashchenko V., Concannon A., ter Beek M., Hopper P., 2004, High holding voltage cascaded LVTSCR structure for 5.5-V tolerant ESD protection clamps, IEEE Transaction on Device and Materials Reliability, pp. 273-280Google Search
6 
Chen W. Y., Ker M.-D., Huang Y.-J., Jou Y.-N., Lin G.-L., 2008, Measurement on Snapback Holding voltage of High-Voltage LDMOS for Latch-up Consideration, circuit and system APCCAS, pp. 61-64DOI
7 
Voldman S. H., 2006, ESD: Circuit and Devices, Wiley, LondonGoogle Search
8 
Ground E., Hernandez M., 2007, Obtaining TLP-like Information from an HBM simulator, EOS/ESD Symp., pp. 2A.3-1-2A.3-7DOI
9 
Morgan I., Hatchard C., Mahanpour M., 1999, Transient latch-up using as improved bi-polar trigger, in Proc. Of EOS/ESD Symp., pp. 190-202DOI
10 
Cui Q., Salcedo J., Parthasarathy S., Zhou Y., Liou J., Hajjar J., 2013, High-robustness and low-capacitance silicon-controlled rectifier for high-speed I/O ESD protection, IEEE Electron Device Letters, pp. 178-180DOI
11 
Do K. I., LEE B. S., 2019, A New Dual-Direction SCR with High Holding Voltage and Low Dynamic Resistance for 5V Application, IEEE Journal of the Electron Devices Society, Vol. 7, pp. 601-605DOI
12 
Jung J. W., 2015, Design of SCR‐Based ESD Protection Circuit for 3.3 V I/O and 20 V Power Clamp, ETRI Journal, Vol. 37, pp. 97-106DOI
13 
Jang S. L., Lin L. S., 2001, Solid-State Electronics, Vol. 45, pp. 2005-2009Google Search