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“JSTS has been indexed and abstracted in the SCIE (Science Citation Index Expanded) since Volume 9, Issue 1 in 2009. Furthermore, it continues to maintain its listing in the SCOPUS database and is recognized as a regular journal by the Korea Research Foundation.

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REFERENCES

1 
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3 
Do K. I., Lee B. S., Koo Y. S., 2019, Study on 4H-SiC GGNMOS Based ESD Protection Circuit With Low Trigger Voltage Using Gate-Body Floating Technique for 70-V Applications, IEEE Electron Device Letters, Vol. 40, No. 2, pp. 283-286DOI
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Do K. I., 2020, A Novel Low Dynamic Resistance Dual-Directional SCR with High Voltage for 12V Applications, IEEE Journal of the Electron Devices Society, Vol. 7, pp. 635-639DOI
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JEDEC / ESD Association , 2014, ESDA/JEDEC Joint Standard For Electrostatic Discharge - Sensitivity Testing - Human Body Model (HBM) - Component Level, ANSI/ESDA/JEDEC JS-001-2014, JEDEC / ESDA Std.Google Search
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Cui Q., 2013, High-robustness and low-capacitance silicon controlled rectifier for high-speed I/O ESD protection, IEEE Electron Device Letter, Vol. 34, No. 2, pp. 178-180DOI
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