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“JSTS has been indexed and abstracted in the SCIE (Science Citation Index Expanded) since Volume 9, Issue 1 in 2009. Furthermore, it continues to maintain its listing in the SCOPUS database and is recognized as a regular journal by the Korea Research Foundation.

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References

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Devika, B, and Neetha George. “Convolutional Neural Network for Semiconductor Wafer Defect Detection.” 2019 10th International Conference on Computing, Communication and Networking Technologies (ICCCNT), 2019, https://doi.org/10.1109/icccnt45670.2019.8944584.DOI
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Chen, Xiaoyan, et al. “A Light-Weighted CNN Model for Wafer Structural Defect Detection.” IEEE Access, vol. 8, 2020, pp. 24006-24018, https://doi.org/10.1109/access.2020.2970461.DOI
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Kim, Tongwha, and Kamran Behdinan. “Advances in Machine Learning and Deep Learning Applications towards Wafer Map Defect Recognition and Classification: A Review.” Journal of Intelligent Manufacturing, 2022, https://doi.org/10.1007/s10845-022-01994-1.DOI