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References

1 
Online article , 2016, HEAT(Hardware Enabled Algorithmic Tester) for 2.5D HBM SolutionGoogle Search
2 
IT & T , Model: T5588, http://www.it-t.co.kr/Google Search
3 
TSE Corp. , , http://tse21.com/_kor/designer/skin/sub_ 02/02_02.asp
4 
Seo S., Cho G., Lee Y., Choi I., Kang S., 2017, Test parallelism improvement and pin reduction method for next generation memory testing using instruction- based BOST, Proc. of Korea Test Conf.(KTC)Google Search
5 
Seo S., Lim H., Kang S., Kang S., 2017, Off-Chip Test Architecture for Improving Multi-Site Testing Efficiency using Tri-State Decoder and 3V-Level Encoder, Proc. of Intl. Symp. on Quality Elec. Design(ISQED)DOI
6 
Chen J. Z., Lee K. J., 2017, Test Stimulus Compression Based on Broadcast Scan With One Single Input, IEEE Trans. on Computer-Aided Design Of Integr. Cir. and Syst., Vol. 36, No. 1, pp. 184-197DOI
7 
Kim H., Lee Y., Kang S., 2015, A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability, IEEE Trans. on RELIABILITY, Vol. 64, No. 1, pp. 486-496DOI
8 
Keezer D. C., Chen T. H., Moon T., Stonecypher D. T., Chatterjee A., Choi H. W., Kim S. Y., Yoo H., 2015, An FPGA-based ATE Extension Module for Low-Cost Multi-GHz Memory Test, Proc. of IEEE Euro. Test Symp.(ETS)DOI
9 
Han D., Lee Y., Kang S., 2014, A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture, ETRI Journal, Vol. 36, No. 2, pp. 293-300DOI
10 
IEEE Std 1149.1-2013, https://standards.ieee.orgGoogle Search
11 
IEEE Std 1500-2005, http://standards.ieee.orgGoogle Search
12 
Bjerregaard T., Mahadevan S., 2006, A survey of research and practices of Network-on-chip, ACM Computing Surveys, Vol. 38, No. , pp. 1-51DOI
13 
Bernardi P., Grosso M., Reorda M. S., Zhang Y., 2010, A Programmable BIST for DRAM testing and diagnosis, Proc. of Intl. Test Conf., Vol. 15, No. 3, pp. 1-10DOI
14 
Simple Parameterizable Network-on-Chip, https://github.com/gtarawneh/simpnocGoogle Search
15 
Jun H., Nam S., Jin H., Lee J. C., Park Y. J., Lee J. J., 2017, High-Bandwidth Memory(HBM) Test Challenges and Solutions, IEEE Design & Test, Vol. 34, No. 1, pp. 16-25DOI