Title A study on Analysis of Convergence Trends in Global BIM Market Using Patent Information
Authors Kim, Taewon ; Lee, Jaeho ; Lee, Yoonsun ; Kim, Jaejun ; Lee, Taisik
DOI http://dx.doi.org/10.6106/KJCEM.2017.18.3.095
Page pp.95-104
ISSN 2005-6095
Keywords Building Information Modeling ; Patent Information ; Technical Trend ; International Patent Classification
Abstract Recently, patent information related to building information modeling (BIM) has been increasing owing to BIM adoption within the construction sector. However, only a few research studies have focused on identifying trends in the domestic and foreign BIM t