Mobile QR Code QR CODE

“JSTS has been indexed and abstracted in the SCIE (Science Citation Index Expanded) since Volume 9, Issue 1 in 2009. Furthermore, it continues to maintain its listing in the SCOPUS database and is recognized as a regular journal by the Korea Research Foundation.

※ The user interface design of www.jsts.org has been recently revised and updated. Please contact inter@theieie.org for any inquiries regarding paper submission.

Journal Search

  1. Home
  2. Archive
  3. 2019-06 (Vol.19 No.03)
  4. 10.5573/JSTS.2019.19.3.300
XML PDF INFO REF

REFERENCES

1 
Koo Yong-Seo, Lee Kwang-Yeob, Kim Kui-Dong, Kwon Jong-ki, 2009, Design of SCR-based ESD Protection Device for Power Clamp using Deep-Submicron CMOS Technology, Micronics Journal, Vol. 40Google Search
2 
Ker M. D., Yen C. C., 2008, Investigation and Design of on-chip Power-Rail ESD Clamp Circuits without Suffering Latch up-Like Failure during System-Level ESD Test, IEEE J. Solid-State Circuits, Vol. 43DOI
3 
Koo Yong-Seo, Lee Kwang-Yeob, Kim Kui-Dong, Kwon Jong-Ki, 2008, The design of high holding voltage SCR for whole-chip ESD protection, IEICE Electron. Express, Vol. 5DOI
4 
Wang AZ, H., 2001, An On-Chip ESD Protection Circuit with Low Trigger Voltage in BiCMOS Technology, IEEE J. Solid-State Circuits, Vol. 36DOI
5 
Semenov Oleg, Sarbishaei Hossein, Sachdev Manoj, 2008, ESD Protection Device and Circuit Design for Advanced CMOS Technologies, (Springer. Waterloo. 2008) 53.Google Search
6 
Barth Jon E., Verhaege Koen, Henry Leo G., Richner John, 2001, TLP Calibration, Correlation, Standards, and New Techniques, IEEE Trans. on Electronics Packaging Manufacturing, Vol. 24DOI
7 
Ground E., Hernandez M., 2007, Obtaining TLP-like Information from an HBM Simulator, 29th Electrical Overstress/Electrostatic Discharge Symp, 2A.3-1DOI
8 
Ground Evan, Hernandez Marcos, 2007, Obtaining TLP-like information from an HBM simulator, Proc. 29th EOS/ESD Symposium, 2A.3-1DOI
9 
Photiwara Wannita, Silapunt Rardchawadee, 2014, Analysis of Electrostatic Discharges Events in TMR and HGA Levels, TENCON 2014 – 2014 IEEE Region 10 ConferenceDOI