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Title Robust Design and Performance Evaluation of High-Speed Overcurrent and Short-Circuit Protection Circuits for SiC Power Semiconductors
Authors Keon-Hee Kim ; Hae-Chan Park ; Kyung-Min Kim ; Rae-Young Kim
DOI https://doi.org/10.6113/TKPE.2025.30.2.139
Page pp.139-147
ISSN 1229-2214
Keywords Desat; Short-Circuit protection; Overcurrent protection; SiC MOSFET