| Title |
Power Hardware-in-the-Loop (PHIL) Simulation Testbed for Testing Electrical Interactions Between Power Converter and Fault Conditions of DC Microgrid |
| Authors |
Kyung-Wook Heo ; Jee-Hoon Jung |
| DOI |
10.6113/TKPE.2021.26.2.150 |
| Keywords |
VSC (Voltage Source Converter); PHIL (Power Hardware-in-the-Loop); DC microgrid; Blackout; DAB (Three-port Dual Active Bridge) converter |
| Abstract |
Nowadays, a DC microgrid that can link various distributed power sources is gaining much attention. Accordingly, research on fault situations, such as line-to-line and line-to-ground faults of the DC microgrid, has been conducted to improve grid reliability. However, the blackout of an AC system and the oscillation of a DC bus voltage have not been reported or have not been sufficiently verified by previous research. In this study, a 20 kW DC microgrid testbed using a power HIL simulation technique is proposed. This testbed can simulate various fault conditions without any additional grid facilities and dangerous experiments. It includes the blackout of the DC microgrid caused by the AC utility grid’s blackout, a drastic load increment, and the DC bus voltage oscillation caused by the LCL filter of the voltage source converter. The effectiveness of the proposed testbed is verified by using Opal-RT’s OP5707 real-time simulator with a 3 kW prototype three-port dual-active-bridge converter. |