| Title |
Degradation Detection of Power Semiconductor Based on Real-time Vds-on Monitoring Techniques |
| Authors |
Hyeonho Jeong ; Sanghyun Moon ; Suwoong Eo ; Hyun-Woo Jung ; Dae-Un Sung ; Jiwon Yoo |
| DOI |
https://doi.org/10.6113/TKPE.2025.30.6.521 |
| ISSN |
1229-2214(pISSN), 2288-6281(eISSN) |
| Keywords |
Power semiconductor; On-state drain-source voltage; Degradation prediagnosis; Degradation indicator |